SM320C6457-HIREL Datasheet, PDF (163/209 Pages) Texas Instruments – SM320C6457-HIREL Communications Infrastructure Digital Signal Processor

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SM320C6457-HIREL
SPRS948 – JULY 2016
4.8.19 Emulation Features and Capability
4.8.19.1 Advanced Event Triggering (AET)
The C6457 device supports Advanced Event Triggering (AET). This capability can be used to debug
complex problems as well as understand performance characteristics of user applications. AET provides
the following capabilities:
• Hardware Program Breakpoints: specify addresses or address ranges that can generate events such
as halting the processor or triggering the trace capture.
• Data Watchpoints: specify data variable addresses, address ranges, or data values that can generate
events such as halting the processor or triggering the trace capture.
• Counters: count the occurrence of an event or cycles for performance monitoring.
• State Sequencing: allows combinations of hardware program breakpoints and data watchpoints to
precisely generate events for complex sequences.
For more information on AET, see the following documents:
• Using Advanced Event Triggering to Find and Fix Intermittent Real-Time Bugs application report
(SPRA753)
• Using Advanced Event Triggering to Debug Real-Time Problems in High Speed Embedded
Microprocessor Systems application report (SPRA387)
4.8.19.2 Trace
The C6457 device supports Trace. Trace is a debug technology that provides a detailed, historical
account of application code execution, timing, and data accesses. Trace collects, compresses, and
exports debug information for analysis. Trace works in real-time and does not impact the execution of the
system.
For more information on board design guidelines for Trace Advanced Emulation, see the 60-Pin Emulation
Header Technical Reference (SPRU655).
4.8.19.2.1 Trace Electrical Data/Timing
Table 4-100. Switching Characteristics for Trace ⁽¹⁾
(see Figure 4-67)
NO. PARAMETER
MIN
1 t_w(DPnH)
1 t_w(DPnH)90%
2 t_w(DPnL)
2 t_w(DPnL)10%
3 t_sko(DPn)
Pulse duration, DPn/EMUn high
Pulse duration, DPn/EMUn high detected at 90% Voh
Pulse duration, DPn/EMUn low
Pulse duration, DPn/EMUn low detected at 10% Voh
Output skew time, time delay difference between DPn/EMUn pins
configured as trace
2.4
1.5
2.4
1.5
-500
(1) Over recommended operating conditions.
MAX UNIT
ns
ns
ns
ns
500 ps
A
t
PLH
B
C
t
PHL
1
2
3
Figure 4-67. Trace Timing
Copyright © 2016, Texas Instruments Incorporated
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