TC217_08 Datasheet, PDF (12/21 Pages) Texas Instruments – pixel ccd image sensor

TC217
ą
1158ĆĂ×Ă488ĆPIXEL CCD IMAGE SENSOR
ą
SOCS015C − OCTOBER 1989 − REVISED JUNE 1996
spurious nonuniformity specification
The spurious nonuniformity specification of the TC217 CCD grades −30 and −40 is based on several sensor
characteristics:
• Amplitude of the nonuniform line or pixel
• Polarity of the nonuniform pixel
− Black
− White
• Column amplitude
The CCD sensors are characterized in both an illuminated condition and a dark condition. In the dark condition,
the nonuniformity is specified in terms of absolute amplitude as shown in Figure 14. In the illuminated condition,
the nonuniformity is specified as a percentage of the total illumination as shown in Figure 15.
The nonuniformity specification for the TC217 is as follows (CCD video-output signal is 50 mV ±10 mV):
PART NUMBER
TC217-30
TC217-40
PIXEL NONUNIFORMITY
DARK CONDITION
ILLUMINATED CONDITION
PIXEL AMPLITUDE, x (mV) % OF TOTAL ILLUMINATION
x ≤ 12 mV
x ≤ 15 mV
x ≤ 10
x ≤ 15
COLUMN NONUNIFORMITY
COLUMN AMPLITUDE, x (mV)
x < 0.5 mV
x ≤ 1 mV
mV
Amplitude
% of Total
Illumination
t
Figure 14. Pixel Nonuniformity,
Dark Condition
t
Figure 15. Pixel Nonuniformity,
Illuminated Condition
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