SN74CBTU4411_16 Datasheet, PDF (10/21 Pages) Texas Instruments – Multiplexer/Demultiplexer

SN74CBTU4411
SCDS192A – APRIL 2005 – REVISED FEBRUARY 2016
7.2 Skew and Propagation Delay Times
VG1
ZO = 40 Ω
VIN
50 Ω
VG2
ZO = 40 Ω
VI
120 Ω
VDD
DUT
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TEST CIRCUIT
ZO = 40 Ω _VO
CL
(see Note A)
RL ^T1†
RL
VDD
2 VDD
GND
TEST
tpd
VDD
1.8 V ± 0.1 V
tosk
1.8 V ± 0.1 V
tesk
1.8 V ± 0.1 V
† _{T1 is an external terminal.}
T1^†
VDD
VDD
VDD
RL
150 Ω
VI
See waveform
150 Ω See waveform
150 Ω See waveform
CL
6 pF
6 pF
6 pF
Input
(H or D)
Output 1
(D or H)
Output 2
(D or H)
50%
Skew
50%
SKEW BETWEEN ANY TWO OUTPUTS
(tosk) (see Note B)
VREF
+0.35 V
VREF
–0.35 V
VOH
VOL
Input
(H or D)
tPLH
VOH
VOL
Output
(D or H)
50%
50%
VREF
+0.35 V
VREF
–0.35 V
tPHL
50%
50%
VOLTAGE WAVEFORMS
(tesk and tpd) (see Note C)
VOH
VOL
A. C_L includes probe and jig capacitance.
B. t_osk is the difference in output voltage from channel to channel in a specific device.
C. t_PLH and t_PHL are the same as t_pd and t_esk = |t_PLH – t_PHL|
D. All input pulses are supplied by generators having the following characteristics: Z_OS = 50 Ω, rising and falling edge
rate is 1 V/ns.
E. The outputs are measured one at a time, with one transition per measurement.
Figure 3. Test Circuit and Voltage Waveforms
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