THS1206-EP Datasheet, PDF (1/43 Pages) Texas Instruments – 12-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTERS

THS1206ĆEP
12ĆBIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOGĆTOĆDIGITAL CONVERTERS
SGLS126A − JULY 2002 − REVISED FEBRUARY 2003
features
D Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D Internal Voltage References . . . 50 PPM/°C
and ±5% Accuracy
D Glueless DSP Interface
D Parallel µC/DSP Interface
D Extended Temperature Performance of
−55°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Integrated FIFO
D Available in TSSOP Package
applications
D Enhanced Product Change Notification
D Qualification Pedigree^†
D High-Speed 6 MSPS ADC
D 4 Single-Ended or 2 Differential Inputs
D Simultaneous Sampling of 4 Single-Ended
Signals or 2 Differential Signals or
Combination of Both
D Differential Nonlinearity Error: ±1 LSB
D Integral Nonlinearity Error: ±1.8 LSB
D Radar Applications
D Communications
D Control Applications
D High-Speed DSP Front-End
D Selected Military Applications
DA PACKAGE
(TOP VIEW)
D Signal-to-Noise and Distortion Ratio: 68 dB
at f_I = 2 MHz
D Auto-Scan Mode for 2, 3, or 4 Inputs
D 3-V or 5-V Digital Interface Compatible
D Low Power: 216 mW Max
D 5-V Analog Single Supply Operation
† _{Component qualification in accordance with JEDEC and industry}
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
D0 ₁
D1 ₂
D2 ₃
D3 4
D4 5
D5 6
BV_DD 7
BGND 8
D6 9
D7 10
D8 11
D9 12
D10/RA0 13
D11/RA1 14
32 ^AINP
31 ^AINM
30 ^BINP
29 BINM
28 REFIN
27 REFOUT
26 REFP
25 REFM
24 AGND
23 AV_DD
22 CS0
21 CS1
20 WR (R/W)
19 RD
description
CONV_CLK (CONVST) 15
DATA_AV 16
18 DV_DD
17 DGND
The THS1206 is a CMOS, low-power, 12-bit,
6 MSPS analog-to-digital converter (ADC). The
speed, resolution, bandwidth, and single-supply
operation are suited for applications in radar,
imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error
correction logic provides for no missing codes over the full operating temperature range. Internal control
registers are used to program the ADC into the desired mode. The THS1206 consists of four analog inputs,
which are sampled simultaneously. These inputs can be selected individually and configured to single-ended
or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to take the load off
of the processor connected to the ADC. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2002 − 2003, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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