BQ4010_14 Datasheet, PDF (1/16 Pages) Texas Instruments – 8 k ´ 8 NONVOLATILE SRAM (5 V, 3.3 V)

Not Recommended For New Designs
bq4010/Y/LY
www.ti.com
SLUS116A – MAY 1999 – REVISED JUNE 2007
8 k × 8 NONVOLATILE SRAM (5 V, 3.3 V)
FEATURES
• Data Retention for at least 10 Years Without
Power
• Automatic Write-Protection During
Power-up/Power-down Cycles
• Conventional SRAM Operation, Including
Unlimited Write Cycles
• Internal Isolation of Battery before Power
Application
• 5-V or 3.3-V Operation
• Industry Standard 28-Pin DIP Pinout
GENERAL DESCRIPTION
The CMOS bq4010/Y/LY is a nonvolatile 65,536-bit
static RAM organized as 8,192 words by 8 bits. The
integral control circuitry and lithium energy source
provide reliable nonvolatility coupled with the
unlimited write cycles of standard SRAM.
The control circuitry constantly monitors the single
supply for an out-of-tolerance condition. When V_CC
falls out of tolerance, the SRAM is unconditionally
write-protected to prevent an inadvertent write
operation.
At this time the integral energy source is switched on
to sustain the memory until after V_CC returns valid.
The bq4010/Y/LY uses extremely low standby
current CMOS SRAMs, coupled with small lithium
coin cells to provide nonvolatility without long
write-cycle times and the write-cycle limitations
associated with EEPROM.
The bq4010/Y/LY requires no external circuitry and is
compatible with the industry-standard 64-Kb SRAM
pinout.
PIN CONNECTIONS
28−Pin DIP Module
(TOP VIEW)
NC ₁
A₁₂ 2
A₇ 3
A₆ 4
A₅ 5
A₄ 6
A₃ 7
A₂ 8
A₁ 9
A₀ 10
DQ₀ 11
DQ₁ 12
DQ₂ 13
V_SS 14
28 V_CC
27 WE
26 NC
25 A₈
24 A₉
23 A₁₁
22 OE
21 A₁₀
20 CE
19 DQ₇
18 DQ₆
17 DQ₅
16 _DQ4
15 _DQ3
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2007, Texas Instruments Incorporated