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BQ34Z100 Datasheet, PDF (7/50 Pages) Texas Instruments – Wide Range Fuel Gauge with Impedance Track™ Technology
bq34z100
www.ti.com
SLUSAU1 – MAY 2012
INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS (continued)
TA = –40°C to 85°C, 2.4 V < REG25 < 2.6 V; Typical Values at TA = 25°C and REG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
tSR_CONV
Conversion time
Resolution
Single conversion
1
s
14
15
bits
VOS(SR)
INL
ZIN(SR)
Ilkg(SR)
Input offset
Integral nonlinearity error
Effective input resistance (1)
Input leakage current(1)
10
µV
±0.007 ±0.034 % FSR
2.5
MΩ
0.3
µA
(1) Assured by design. Not tested in production.
ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
TA = –40°C to 85°C, 2.4 V < REG25 < 2.6 V; Typical Values at TA = 25°C and REG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
VIN(ADC)
tADC_CONV
Input voltage range
Conversion time
Resolution
0.05
1
V
125
ms
14
15
bits
VOS(ADC)
Input offset
1
mV
ZADC1
Effective input resistance (TS) (1)
8
MΩ
ZADC2
Effective input resistance (BAT)(1)
bq34z100 not measuring cell
voltage
8
MΩ
bq34z100 measuring cell voltage
100
KΩ
Ilkg(ADC)
Input leakage current (1)
0.3
µA
DATA FLASH MEMORY CHARACTERISTICS
TA = –40°C to 85°C, 2.4 V < REG25 < 2.6 V; Typical Values at TA = 25°C and REG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Data retention(1)
tDR
Flash-programming write cycles(1)
10
20,000
Years
Cycles
tWORDPROG
ICCPROG
Word programming time(1)
Flash-write supply current(1)
2
ms
5
10
mA
(1) Assured by design. Not tested in production.
HDQ COMMUNICATION TIMING CHARACTERISTICS
TA = –40°C to 85°C, CREG = 0.47 μF, 2.45 V < VREGIN = VBAT < 5.5 V; typical values at TA = 25°C and VREGIN = VBAT = 3.6 V
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
t(CYCH)
t(CYCD)
t(HW1)
t(DW1)
t(HW0)
t(DW0)
t(RSPS)
t(B)
t(BR)
t(RISE)
Cycle time, host to bq34z100
Cycle time, bq34z100 to host
Host sends 1 to bq34z100
bq34z100 sends 1 to host
Host sends 0 to bq34z100
bq34z100 sends 0 to host
Response time, bq34z100 to host
Break time
Break recovery time
HDQ line rising time to logic 1 (1.2
V)
190
μs
190
205
250
μs
0.5
50
μs
32
50
μs
86
145
μs
80
145
μs
190
950
μs
190
μs
40
μs
950
ns
t(RST)
HDQ Reset
1.8
2.2
s
Copyright © 2012, Texas Instruments Incorporated
Product Folder Link(s): bq34z100
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