LPV521MGX Datasheet, PDF (6/29 Pages) Texas Instruments – LPV521 Nanopower, 1.8V, RRIO, CMOS Input, Operational Amplifier

LPV521
SNOSB14C – AUGUST 2009 – REVISED FEBRUARY 2013
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5V DC Electrical Characteristics⁽¹⁾ (continued)
Unless otherwise specified, all limits guaranteed for T_A = 25°C, V⁺ = 5V, V^− = 0V, V_CM = V_O = V⁺/2, and R_L > 1MΩ. Boldface
limits apply at the temperature extremes.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
(2)
(3)
(2)
TCV_OS
I_BIAS
Input Offset Voltage Drift⁽⁴⁾
Input Bias Current
±0.4
±3.5
μV/°C
0.04
±1
±50
pA
I_OS
CMRR
Input Offset Current
Common Mode Rejection Ratio
0V ≤ V_CM ≤ 5.0V
60
fA
75
102
74
0V ≤ V_CM ≤ 3.9V
84
108
80
dB
PSRR
CMVR
Power Supply Rejection Ratio
Common Mode Voltage Range
4.4V ≤ V_CM ≤ 5.0V
1.6V ≤ V⁺ ≤ 5.5V
V_CM = 0.3V
CMRR ≥ 75 dB
CMRR ≥ 74 dB
77
115
76
85
109
76
dB
−0.1
0
5.1
5
V
A_VOL
V_O
I_O
Large Signal Voltage Gain
Output Swing High
Output Swing Low
Output Current⁽⁵⁾
I_S
Supply Current
V_O = 0.5V to 4.5V
R_L = 100 kΩ to V⁺/2
R_L = 100 kΩ to V⁺/2
V_IN(diff) = 100 mV
R_L = 100 kΩ to V⁺/2
V_IN (diff) = −100 mV
Sourcing, V_O to V^−
V_IN(diff) = 100 mV
Sinking, V_O to V⁺
V_IN(diff) = −100 mV
V_CM = 0.3V
V_CM = 4.7V
84
132
dB
76
3
50
50
mV from
3
50
either rail
50
15
23
8
mA
15
22
8
351
400
620
nA
475
600
870
(4) The offset voltage average drift is determined by dividing the change in V_OS at the temperature extremes by the total temperature
change.
(5) The short circuit test is a momentary open loop test.
5V AC Electrical Characteristics⁽¹⁾
Unless otherwise specified, all limits guaranteed for T_A = 25°C, V⁺ = 5V, V^− = 0V, V_CM = V_O = V⁺/2, and R_L > 1MΩ. Boldface
limits apply at the temperature extremes.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
(2)
(3)
(2)
GBW
SR
Gain-Bandwidth Product
Slew Rate
θ_m
Phase Margin
G_m
Gain Margin
C_L = 20 pF, R_L = 100 kΩ
6.2
A_V = +1,
Falling Edge
1.1
2.7
V_IN = 0V to 5V
1.2
Rising Edge
1.1
2.4
1.2
C_L = 20 pF, R_L = 100 kΩ
73
C_L = 20 pF, R_L = 100 kΩ
20
kHz
V/ms
deg
dB
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T_J > T_A. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) All limits are guaranteed by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production
material.
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