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LMH6624MF Datasheet, PDF (5/31 Pages) Texas Instruments – LMH6624/LMH6626 Single/Dual Ultra Low Noise Wideband Operational Amplifier | |||
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LMH6624
www.ti.com
SNOSA42F â NOVEMBER 2002 â REVISED MARCH 2013
±6V Electrical Characteristics
Unless otherwise specified, all limits ensured at TA = 25°C, V+ = 6V, Vâ = â6V, VCM = 0V, AV = +20, RF = 500â¦, RL = 100â¦.
Boldface limits apply at the temperature extremes. See (1).
Symbol
Parameter
Conditions
Min
Typ
Max
Units
(2)
(3)
(2)
Dynamic Performance
fCL
â3dB BW
SR
Slew Rate (4)
tr
Rise Time
tf
Fall Time
ts
Settling Time 0.1%
Distortion and Noise Response
en
Input Referred Voltage Noise
in
Input Referred Current Noise
HD2
HD3
2nd Harmonic Distortion
3rd Harmonic Distortion
Input Characteristics
VOS
Input Offset Voltage
VO = 400mVPP (LMH6624)
VO = 400mVPP (LMH6626)
VO = 2VPP, AV = +20 (LMH6624)
VO = 2VPP, AV = +20 (LMH6626)
VO = 2VPP, AV = +10 (LMH6624)
VO = 2VPP, AV = +10 (LMH6626)
VO = 400mV Step, 10% to 90%
VO = 400mV Step, 10% to 90%
VO = 2VPP (Step)
f = 1MHz (LMH6624)
f = 1MHz (LMH6626)
f = 1MHz (LMH6624)
f = 1MHz (LMH6626)
fC = 10MHz, VO = 1VPP, RL 100â¦
fC = 10MHz, VO = 1VPP, RL 100â¦
VCM = 0V
Average Drift (5)
VCM = 0V
IOS
Input Offset Current Average Drift (LMH6624)
(5)
VCM = 0V
(LMH6626)
VCM = 0V
VCM = 0V
IB
Input Bias Current
VCM = 0V
RIN
CIN
CMRR
Average Drift (5)
Input Resistance (6)
Input Capacitance (6)
Common Mode Rejection Ratio
Transfer Characteristics
AVOL
Large Signal Voltage Gain
VCM = 0V
Common Mode
Differential Mode
Common Mode
Differential Mode
Input Referred,
VCM = â4.5 to +5.25V
VCM = â4.5 to +5.0V
(LMH6624)
RL = 100â¦, VO = â3V to +3V
(LMH6626)
RL = 100â¦, VO = â3V to +3V
â0.5
â0.7
â1.1
â2.5
â2.0
â2.5
90
87
77
72
74
70
95
85
350
320
400
360
3.7
3.7
18
0.92
1.0
2.3
1.8
â63
â80
±0.10
±0.2
0.05
0.1
0.7
13
12
6.6
4.6
0.9
2.0
95
81
80
MHz
V/μs
ns
ns
ns
+0.5
+0.7
1.1
2.5
2.0
2.5
+20
+25
nV/âHz
pA/âHz
dBc
dBc
mV
μV/°C
μA
nA/°C
μA
nA/°C
Mâ¦
kâ¦
pF
dB
dB
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ > TA. Absolute maximum ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing or statistical analysis.
(3) Typical Values represent the most likely parametric norm.
(4) Slew rate is the slowest of the rising and falling slew rates.
(5) Average drift is determined by dividing the change in parameter at temperature extremes into the total temperature change.
(6) Simulation results.
Copyright © 2002â2013, Texas Instruments Incorporated
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