LMH6624MF Datasheet, PDF (3/31 Pages) Texas Instruments – LMH6624/LMH6626 Single/Dual Ultra Low Noise Wideband Operational Amplifier

LMH6624
www.ti.com
SNOSA42F – NOVEMBER 2002 – REVISED MARCH 2013
±2.5V Electrical Characteristics
Unless otherwise specified, all limits ensured at T_A = 25°C, V⁺ = 2.5V, V^− = −2.5V, V_CM = 0V, A_V = +20, R_F = 500Ω, R_L =
100Ω. Boldface limits apply at the temperature extremes. See ⁽¹⁾.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
(2)
(3)
(2)
Dynamic Performance
f_CL
−3dB BW
SR
Slew Rate⁽⁴⁾
t_r
Rise Time
t_f
Fall Time
t_s
Settling Time 0.1%
Distortion and Noise Response
e_n
Input Referred Voltage Noise
i_n
Input Referred Current Noise
HD2
HD3
2^nd Harmonic Distortion
3^rd Harmonic Distortion
Input Characteristics
V_OS
Input Offset Voltage
Average Drift ⁽⁵⁾
I_OS
Input Offset Current
Average Drift ⁽⁵⁾
I_B
Input Bias Current
Average Drift ⁽⁵⁾
R_IN
Input Resistance ⁽⁶⁾
C_IN
Input Capacitance ⁽⁶⁾
CMRR
Common Mode Rejection Ratio
Transfer Characteristics
A_VOL
Large Signal Voltage Gain
X_t
Crosstalk Rejection
V_O = 400mV_PP (LMH6624)
V_O = 400mV_PP (LMH6626)
V_O = 2V_PP, A_V = +20 (LMH6624)
V_O = 2V_PP, A_V = +20 (LMH6626)
V_O = 2V_PP, A_V = +10 (LMH6624)
V_O = 2V_PP, A_V = +10 (LMH6626)
V_O = 400mV Step, 10% to 90%
V_O = 400mV Step, 10% to 90%
V_O = 2V_PP (Step)
f = 1MHz (LMH6624)
f = 1MHz (LMH6626)
f = 1MHz (LMH6624)
f = 1MHz (LMH6626)
f_C = 10MHz, V_O = 1V_PP, R_L 100Ω
f_C = 10MHz, V_O = 1V_PP, R_L 100Ω
V_CM = 0V
V_CM = 0V
V_CM = 0V
V_CM = 0V
V_CM = 0V
V_CM = 0V
Common Mode
Differential Mode
Common Mode
Differential Mode
Input Referred,
V_CM = −0.5 to +1.9V
V_CM = −0.5 to +1.75V
(LMH6624)
R_L = 100Ω, V_O = −1V to +1V
(LMH6626)
R_L = 100Ω, V_O = −1V to +1V
f = 1MHz (LMH6626)
−0.75
−0.95
−1.5
−2.0
87
85
75
70
72
67
90
80
300
290
360
340
4.1
4.1
20
0.92
1.0
2.3
1.8
−60
−76
−0.25
±0.25
−0.05
2
13
12
6.6
4.6
0.9
2.0
90
79
79
−75
MHz
V/μs
ns
ns
ns
+0.75
+0.95
+1.5
+2.0
+20
+25
nV/√Hz
pA/√Hz
dBc
dBc
mV
μV/°C
μA
nA/°C
μA
nA/°C
MΩ
kΩ
pF
dB
dB
dB
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T_J > T_A. Absolute maximum ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing or statistical analysis.
(3) Typical Values represent the most likely parametric norm.
(4) Slew rate is the slowest of the rising and falling slew rates.
(5) Average drift is determined by dividing the change in parameter at temperature extremes into the total temperature change.
(6) Simulation results.
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