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STB27NM60ND Datasheet, PDF (6/19 Pages) STMicroelectronics – Low input capacitance and gate charge
Electrical characteristics
STB27NM60ND, STW27NM60ND
Table 7. Source drain diode
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
ISD Source-drain current
-
ISDM (1) Source-drain current (pulsed)
-
VSD (2) Forward on voltage
ISD = 21 A, VGS = 0
-
21 A
84 A
1.3 V
trr
Reverse recovery time
ISD = 21 A, VDD = 60 V
-
160
ns
Qrr Reverse recovery charge
di/dt=100 A/µs
-
1
µC
IRRM Reverse recovery current
(see Figure 18)
-
15
A
trr
Reverse recovery time
ISD = 21 A,VDD = 60 V
- 230
ns
Qrr Reverse recovery charge
di/dt=100 A/µs,
TJ = 150 °C
-
2
µC
IRRM Reverse recovery current
(see Figure 18)
-
19
A
1. Pulse width limited by safe operating area
2. Pulsed: Pulse duration = 300 µs, duty cycle 1.5%.
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