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STDLED623 Datasheet, PDF (5/18 Pages) STMicroelectronics – Very low intrinsic capacitance
STDLED623, STULED623
Electrical characteristics
Symbol
Parameter
td(on)
tr
td(off)
tf
Turn-on delay time
Rise time
Turn-off-delay time
Fall time
Table 7. Switching times
Test conditions
VDD = 310 V, ID =1.1 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 15)
Min.
-
-
-
-
Typ.
8
4.4
21
22
Max. Unit
-
ns
-
ns
-
ns
-
ns
Table 8. Source-drain diode
) Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
t(s ISD
uc ISDM(1)
d VSD(2)
Source-drain current
Source-drain current (pulsed)
Forward on voltage
ISD = 2.2 A, VGS = 0
ro trr
te P Qrr
le IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 2.2 A, di/dt = 100 A/µs
VDD = 60 V (see Figure 20)
o trr
bs Qrr
O IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 2.2 A, di/dt = 100 A/µs
VDD = 60 V, Tj = 150 °C
(see Figure 20)
) - 1. Pulse width limited by safe operating area.
t(s 2. Pulsed: Pulse duration = 300 µs, duty cycle 1.5%.
-
2.2 A
-
8.8 A
-
1.6 V
- 200
ns
- 900
nC
-
9
A
- 240
ns
- 1150
nC
- 10
A
roduc Table 9. Gate-source Zener diode
P Symbol
Parameter
Test conditions
leteBVGSO
Gate-source breakdown
voltage
IGS = ± 1 mA (open drain)
Min. Typ. Max. Unit
30 -
-V
bso The built-in back-to-back Zener diodes have specifically been designed to enhance not only
O the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
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