English
Language : 

STD9N40M2 Datasheet, PDF (5/16 Pages) STMicroelectronics – Low gate input resistance
STD9N40M2
Electrical characteristics
Symbol
Table 8. Source drain diode
Parameter
Test conditions
Min. Typ. Max. Unit
ISD
(1)
ISDM
(2)
VSD
Source-drain current
Source-drain current (pulsed)
Forward on voltage
VGS = 0, ISD = 6 A
-
6A
-
24 A
-
1.6 V
trr Reverse recovery time
- 208
ns
ISD = 6 A, di/dt = 100 A/μs
Qrr Reverse recovery charge
-
VDD = 60 V (see Figure 16)
1.2
μC
IRRM Reverse recovery current
- 11.5
A
trr Reverse recovery time
ISD = 6 A, di/dt = 100 A/μs
- 264
ns
Qrr Reverse recovery charge VDD = 60 V, Tj = 150 °C
- 1.6
μC
IRRM Reverse recovery current
(see Figure 16)
- 12.5
A
1. Pulse width limited by safe operating area.
2. Pulsed: pulse duration = 300 μs, duty cycle 1.5%
DocID025752 Rev 2
5/16
16