M34E04B Datasheet, PDF (26/35 Pages) STMicroelectronics – 4-Kbit Serial Presence Detect EEPROM compatible

DC and AC parameters
M34E04B
Symbol
Table 12. DC characteristics
Parameter
Test condition (in addition to
those in Table 7)
Min
Max Unit
I_LI
Input leakage current (SCL,
SDA, SA0, SA1, SA2)
V_IN = V_SS or V_CC
-
±2
µA
I_LO Output leakage current
I_CC Supply current (read)
I_CC0 Supply current (write)
I_CC1 Standby supply current
V_IL
Input low voltage
(SCL, SDA)
SDA in Hi-Z, external voltage
applied on SDA: V_SS or V_CC
f_c = 400 kHz or 1 MHz
During t_W, V_{IN =} V_SS or V_CC
Device not selected ⁽²⁾,
V_IN = V_SS or V_CC, V_CC ≥ 2.2 V
Device not selected ⁽²⁾,
V_IN = V_SS or V_CC, V_CC < 2.2 V
-
-
-
-
-
-
-0.45
±2
µA
1
mA
1 ⁽¹⁾
mA
2
µA
1
µA
0.3 V_CC V
V_IH
Input high voltage
(SCL, SDA)
-
0.7V_CC V_CC+1 V
V_HV SA0 high voltage detect
V_CC < 2.2 V
V_CC ≥ 2.2 V
7
10
V
V_CC
+4.8 V
10
V
I_OL = 20 mA, V_CC ≥ 2.2 V
-
0.4
V
V_OL Output low voltage
I_OL = 6 mA, V_CC ≤2 V
-
0.6
V
V_POR
V_PDR
Power on reset threshold
Power down reset threshold
I_OL = 3 mA, V_CC ≤2 V
-
-
-
0.4
V
-
1.4 ⁽¹⁾
V
0.7 ⁽¹⁾
-
V
1. Measured during characterization, not tested in production.
2. The device is not selected after a power-up, after a read command (after the Stop condition), or after the
completion of the internal write cycle t_W (t_W is triggered by the correct decoding of a write command).
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