M34E04B Datasheet, PDF (25/35 Pages) STMicroelectronics – 4-Kbit Serial Presence Detect EEPROM compatible

M34E04B
DC and AC parameters
Table 9. Input parameters
Symbol
Parameter ⁽¹⁾
Test
condition
Min. Max.
C_IN Input capacitance (SDA)
-
-
8
C_IN Input capacitance (other pins)
-
-
6
Z_EiL SA0, SA1, SA2 input impedance
V_IN < 0.3V_CC 30
-
Z_EiH SA0, SA1, SA2 input impedance
V_IN > 0.7V_CC 800
-
t_NS Pulse width ignored (input filter on SCL and SDA)
-
- 100
1. Characterized, not tested in production.
Unit
pF
pF
kΩ
kΩ
ns
Symbol
Ncycle
Parameter
Write cycle
endurance
Table 10. Cycling performance
Test condition
T_A ≤ 25 °C, V_CC(min) < V_CC < V_CC(max)
T_A = 85 °C, V_CC(min) < V_CC < V_CC(max)
Max.
4,000,000
1,200,000
Unit
Write cycle
Table 11. Memory cell data retention
Parameter
Test condition
Min.
Data retention⁽¹⁾
T_A = 55 °C
200
1. The data retention behavior is checked in production, while the 200-year limit is defined from
characterization and qualification results.
Unit
Year
DocID028428 Rev 1
25/35
34