ST72325XXX Datasheet, PDF (205/243 Pages) STMicroelectronics – SCI asynchronous serial interface

ST72325xxx-Auto
Electrical characteristics
Table 126. ESD absolute maximum ratings
Symbol
Ratings
Conditions
Max. value⁽¹⁾ Unit
V_ESD(HBM)
Electrostatic discharge voltage
(Human Body Model)
V_ESD(MM)
Electrostatic discharge voltage
(Machine Model)
T_A  +25°C
2000
V
200
1. Data based on characterization results, not tested in production.
Static and dynamic latch-up
● LU: Three complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
● DLU: Electrostatic discharges (one positive then one negative test) are applied to each
pin of three samples when the micro is running to assess the latch-up performance in
) ^{dynamic mode. Power supplies are set to the typical values, the oscillator is connected}
t(s ^{as near as possible to the pins of the micro and the component is put in reset mode.}
This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
c _{refer to the application note AN1181.}
rodu ^{Table 127. Electrical sensitivities}
P _Symbol
Parameter
Conditions
Class⁽¹⁾
te _{TA  +25°C}
A
le ^LU
Static latch-up class
T_A  +85°C
A
o T_A  +125°C
A
bs DLU
Dynamic latch-up class V_DD = 5.5V, f_OSC = 4 MHz, T_A = +25°C
A
O _{1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the}
- JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B
Obsolete ^{Product(s) Class strictly covers all the JEDEC criteria (international standard).}
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