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| ST10F272 Datasheet, PDF (127/179 Pages) STMicroelectronics – 16-bit MCU with 256 Kbyte Flash memory and 20 Kbyte RAM | |||
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ST10F272
24 Electrical characteristics
Electrical characteristics
24.1 Absolute maximum ratings
Table 59. Absolute maximum ratings
Symbol
Parameter
VDD
VSTBY
VAREF
VAGND
VIO
IOV
ITOV
TST
ESD
Voltage on VDD pins with respect to ground (VSS)
Voltage on VSTBY pin with respect to ground (VSS)
Voltage on VAREF pins with respect to ground (VSS)
Voltage on VAGND pins with respect to ground (VSS)
Voltage on any pin with respect to ground (VSS)
Input current on any pin during overload condition
Absolute sum of all input currents during overload condition
Storage temperature
ESD Susceptibility (Human Body Model)
Values
Unit
-0.5 to +6.5
V
-0.5 to +6.5
V
-0.3 to VDD
V
VSS
V
-0.5 to VDD + 0.5
V
± 10
mA
| 75 |
mA
-65 to +150
°C
2000
V
Note:
Stresses above those listed under âAbsolute Maximum Ratingsâ may cause permanent
damage to the device. This is a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability. During overload conditions (VIN > VDD or VIN < VSS) the
voltage on pins with respect to ground (VSS) must not exceed the values defined by the
Absolute Maximum Ratings.
During Power-on and Power-off transients (including Standby entering/exiting phases), the
relationships between voltages applied to the device and the main VDD shall be always
respected. In particular power-on and power-off of VAREF shall be coherent with VDD
transient, in order to avoid undesired current injection through the on-chip protection diodes.
127/179
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