LSM303DLH Datasheet, PDF (12/47 Pages) STMicroelectronics – Sensor module: 3-axis accelerometer and 3-axis magnetometer

Module specifications
LSM303DLH
Table 3. Mechanical characteristics (continued)
Symbol
Parameter
Test conditions
Min. Typ.⁽¹⁾ Max.
Unit
LA_TCSo
Linear acceleration sensitivity
change vs. temperature
FS bit set to 00
Linear acceleration typical
LA_TyOff zero-g level offset
accuracy^(3),(4)
FS bit set to 00
LA_TCOff
Linear acceleration zero-g level
change vs temperature
Max delta from 25 °C
LA_An Acceleration noise density
FS bit set to 00
FS bit set to 00
X axis
LA_Vst
Linear acceleration self-test
output change^(5),(6),(7)
FS bit set to 00
Y axis
FS bit set to 00
Z axis
±0.01
±20
±0.1
218
300
-300
350
%/°C
mg
mg/°C
µg/√ Hz
LSb
LSb
LSb
Cross field = 0.5 gauss
M_CAS Magnetic cross-axis sensitivity
Happlied = ±3 gauss
%FS/
±1
gauss
M_EF Maximum exposed field
No permitting effect on
zero reading
10000 gauss
Positive bias mode, GN
bits set to 100 on X, Y axis
270
LSB
M_ST Magnetic self test
Positive bias mode, GN
bits set to 100 on Z axis
255
LSB
M_R Magnetic resolution
Vdd = 3 V
8
mgauss
M_DF Disturbing field
Sensitivity starts to
degrade. User S/R pulse to
restore sensitivity
20
gauss
Top Operating temperature range
-30
+85
°C
1. Typical specifications are not guaranteed
2. Verified by wafer level test and measurement of initial offset and sensitivity
3. Typical zero-g level offset value after MSL3 preconditioning
4. Offset can be eliminated by enabling the built-in high-pass filter
5. The sign of “Self-test output change” is defined by the CTRL_REG4 STsign bit (Table 29), for all axes.
6. Self-test output changes with the power supply. “Self-test output change” is defined as
OUTPUT[LSb]_{(CTRL_REG4 ST bit=1)} - OUTPUT[LSb]_{(CTRL_REG4 ST bit=0)}. 1LSb=4g/4096 at 12bit representation, ±2 g full-scale
7. Output data reach 99% of final value after 1/ODR+1ms when enabling self-test mode, due to device filtering
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