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| HDN1102W-TR Datasheet, PDF (21/22 Pages) STANLEY ELECTRIC CO.,LTD. – 3.0 x 1.5 size, with Inner Lens Infrared emitting diode | |||
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Reliability Testing Result
HDN1102W-TR
1. Reliability Testing Result
TEST ITEM
Operating life
Humidity (Steady state)
High temperature (Storage)
Low temperature (Storage)
Temperature cycling
Resistance to soldering heat
Vibration fatigue
TEST CONDITION
Ta=25â IF=50mA
Ta=60âã Rh=90%
DURATION
1,000h
1,000h
Ta=100â
1,000h
Ta=-40â
1,000h
Ta=-40âï¼30min.ï¼ãï½ã25âï¼15min.ï¼ãï½
100âï¼30min.ï¼ãï½ã25âï¼15min.ï¼
Moisture Soak ï¼ Ta=30â, RH=70%, 72h
Preheating ï¼ 150ï½180âã120sec. Max.
Soldering ï¼ 230ï½260â 40sec. Max.
98.1m/s2(10G) 100ï½2,000Hz 20min. Sweep XYZdirection
5cycles
2 times
2h of each
direction
2. Failure Criteria
Item
Radiant Intensity
Forward Voltage
Cosmetic appearance
Symbol
IE
VF
-
Conditions
IF=20mA
IF=20mA
-
Failure Criteria
Testing Min. Value ï¼ Initial Value Min. Ã 0.5
Testing Max. Value ⧠Initial Value Max. à 1.2
Notable Discoloration, Deformation and Cracking
2014.10.28
Page : 21
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