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SI514 Datasheet, PDF (5/36 Pages) Silicon Laboratories – ANY-FREQUENCY IC PROGRAMMABLE XO
Si514
Table 3. Output Clock Frequency Characteristics
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC
Parameter
Programmable
Frequency Range
Frequency
Reprogramming
Resolution
Frequency Range for
Small Frequency Change
(Continuous Glitchless
Output)
Settling time for Small
Frequency Change
Settling time for Large
Frequency Change (Out-
put Squelched during Fre-
quency Transition)
Total Stability*
Symbol
FO
FO
MRES
Test Condition
CMOS, Dual CMOS
LVDS/LVPECL/HCSL
From center frequency
<±1000 ppm from
center frequency
>±1000 ppm from
center frequency
Frequency Stability Grade C
Frequency Stability Grade B
Frequency Stability Grade A
Min
Typ
Max Units
0.1
—
212.5 MHz
0.1
—
250 MHz
—
0.026
—
ppb
–1000
—
+1000 ppm
—
—
100
µs
—
—
10
ms
–30
—
+30
ppm
–50
—
+50
ppm
–100
—
+100 ppm
Temperature Stability
Startup Time
Disable Time
Enable Time
Frequency Stability Grade C
–20
—
+20
ppm
Frequency Stability Grade B
–25
—
+25
ppm
Frequency Stability Grade A
–50
—
+50
ppm
TSU
Minimum VDD until output
—
—
10
ms
frequency (FO) within specification
TD
FO < 10 MHz
—
—
40
µs
FO  10 MHz
—
—
5
µs
TE
FO < 10 MHz
—
—
60
µs
FO  10 MHz
—
—
20
µs
*Note: Total stability includes initial accuracy, operating temperature, supply voltage change, load change, shock and
vibration (not under operation), and 10 years aging at 40 oC.
Rev. 1.0
5