SI88240ED-IS Datasheet, PDF (15/48 Pages) Silicon Laboratories – QUAD DIGITAL ISOLATORS WITH DC-DC CONVERTER

Si88x4x
Table 4. Insulation and Safety-Related Specifications
Parameter
Symbol
Test Condition
Value
Unit
Nominal Air Gap (Clearance)
L(1O1)
WB SOIC-20
WB SOIC-24
8.0¹
mm
Nominal External Tracking (Creepage)
L(1O2)
8.0¹
mm
Minimum Internal Gap
(Internal Clearance)
0.014
mm
Tracking Resistance (Proof Tracking Index)
PTI
IEC60112
600
V
Erosion Depth
ED
0.019
mm
Resistance (Input-Output)²
Capacitance (Input-Output)²
Input Capacitance³
R_IO
C_IO
f = 1 MHz
C_I
10¹²

1.4
pF
4.0
pF
Notes:
1. The values in this table correspond to the nominal creepage and clearance values. VDE certifies the clearance and
creepage limits as 8.5 mm minimum for the WB SOIC-20 and WB SOIC-24 packages. UL does not impose a clearance
and creepage minimum for component-level certifications. CSA certifies the clearance and creepage limits as 7.6 mm
minimum for the WB SOIC-20 and WB SOIC-24 packages.
2. To determine resistance and capacitance, the Si88xx is converted into a 2-terminal device. Pins 1–8 are shorted
together to form the first terminal and pins 9–16 are shorted together to form the second terminal. The parameters are
then measured between these two terminals.
3. Measured from input to ground.
Table 5. IEC 60664-1 (VDE 0884-10) Ratings
Parameter
Test Condition
Basic Isolation Group
Installation Classification
Material Group
Rate Mains Voltages <150 V_RMS
Rate Mains Voltages <300 V_RMS
Rate Mains Voltages <400 V_RMS
Rate Mains Voltages <600 V_RMS
Specification
WB SOIC-20
WB SOIC-24
I
I–IV
I–IV
I–III
I–III
Preliminary Rev. 0.6
15