S-8215AAA-K8T2U Datasheet, PDF (9/29 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 3-SERIAL TO 5-SERIAL CELL PACK

BATTERY PROTECTION IC FOR 3-SERIAL TO 5-SERIAL CELL PACK (SECONDARY PROTECTION)
Rev.2.3_02
S-8215A Series
2. 3 Output current of Pch open-drain output product
Set SW1 and SW2 to OFF.
2. 3. 1 Active "H"
(1) CO pin source current (I_COH)
Set SW1 to ON after setting V1 = 5.5 V, V2 to V5 = 3.0 V, V6 = 0.5 V. I1 is the CO pin source current (I_COH) at
that time.
(2) CO pin leakage current "H" (I_COLH)
Set V1 to V5 = 3.5 V, V6 = 17.5 V. I1 is the CO pin leakage current "H" (I_COLH) at that time.
2. 3. 2 Active "L"
(1) CO pin source current (I_COH)
Set SW1 to ON after setting V1 to V5 = 3.5 V, V6 = 0.5 V. I1 is the CO pin source current (I_COH) at that time.
(2) CO pin leakage current "H" (I_COLH)
Set V1 = 5.5 V, V2 to V5 = 3.0 V, V6 = 17.5 V. I1 is the CO pin leakage current "H" (I_COLH) at that time.
3. Overcharge detection delay time (t_CU)
(Test circuit 1)
Increase V1 up to 5.0 V after setting V1 = V2 = V3 = V4 = V5 = 3.5 V. The overcharge detection delay time (t_CU) is the
time period until the CO pin output changes.
4. Overcharge timer reset delay time (t_TR)
(Test circuit 1)
Increase V1 up to 5.0 V (first rise), and decrease V1 down to 3.5 V within t_CU after setting V1 = V2 = V3 = V4 = V5 =
3.5 V. After that, increase V1 up to 5.0 V again (second rise), and detect the time period till the CO pin output changes.
When the period from when V1 has fallen to the second rise is short, CO pin output changes after t_CU has elapsed since
the first rise. If the period is gradually made longer, CO pin output changes after t_CU has elapsed since the second rise.
The overcharge timer reset delay time (t_TR) is the period from V1 fall till the second rise at that time.
5. Transition time to test mode (t_TST)
(Test circuit 2)
Increase V6 up to 5.0 V, and decrease V6 again to 0 V after setting V1 = V2 = V3 = V4 = V5 = 3.5 V, and V6 = 0 V.
When the period from when V6 was raised to when it has fallen is short, if an overcharge detection operation is
performed subsequently, the delay time is t_CU. However, when the period from when V6 is raised to when it has fallen is
gradually made longer, the delay time during the subsequent overcharge detection operation is shorter than t_CU. The
transition time to test mode (t_TST) is the period from when V6 was raised to when it has fallen at that time.
9