S-8211DAD-M5T1X Datasheet, PDF (13/38 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC

Rev.6.5_02
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211D Series
7. Current consumption during power-down, current consumption during overdischarge
(Test condition 4, test circuit 2)
7. 1 With power-down function
The current consumption during power-down (IPDN) is the current that flows through the VDD pin (IDD) under the set
conditions of V1 = V2 = 1.5 V (overdischarge status).
7. 2 Without power-down function
The current consumption during overdischarge (IOPED) is the current that flows through the VDD pin (IDD) under the set
conditions of V1 = V2 = 1.5 V (overdischarge status).
8. Resistance between VM pin and VDD pin
(Test condition 5, test circuit 3)
The resistance between the VM pin and the VDD pin (RVMD) is the resistance between the VM pin and the VDD pin
under the set conditions of V1 = 1.8 V, V2 = 0 V.
9. Resistance between VM pin and VSS pin
(Test condition 5, test circuit 3)
The resistance between the VM pin and the VSS pin (RVMS) is the resistance between the VM pin and the VSS pin
under the set conditions of V1 = 3.5 V, V2 = 1.0 V.
10. CO pin resistance "H"
(Test condition 6, test circuit 4)
The CO pin resistance "H" (RCOH) is the resistance at the CO pin under the set conditions of V1 = 3.5 V, V2 = 0 V, V3 = 3.0 V.
11. CO pin resistance "L"
(Test condition 6, test circuit 4)
The CO pin resistance "L" (RCOL) is the resistance at the CO pin under the set conditions of V1 = 4.5 V, V2 = 0 V, V3 = 0.5 V.
12. DO pin resistance "H"
(Test condition 7, test circuit 4)
The DO pin resistance "H" (RDOH) is the resistance at the DO pin under the set conditions of V1 = 3.5 V, V2 = 0 V, V4 = 3.0 V.
13. DO pin resistance "L"
(Test condition 7, test circuit 4)
The DO pin resistance "L" (RDOL) is the resistance at the DO pin under the set conditions of V1 = 1.8 V, V2 = 0 V, V4 = 0.5 V.
14. Overcharge detection delay time
(Test condition 8, test circuit 5)
The overcharge detection delay time (tCU) is the time needed for VCO to change from "H" to "L" just after the voltage V1
momentarily increases (within 10 μs) from overcharge detection voltage (VCU) − 0.2 V to overcharge detection voltage
(VCU) + 0.2 V under the set conditions of V2 = 0 V.
15. Overdischarge detection delay tme
(Test condition 8, test circuit 5)
The overdischarge detection delay time (tDL) is the time needed for VDO to change from "H" to "L" just after the voltage
V1 momentarily decreases (within 10 μs) from overdischarge detection voltage (VDL) + 0.2 V to overdischarge
detection voltage (VDL) − 0.2 V under the set condition of V2 = 0 V.
13