S-8211DAD-M5T1X Datasheet, PDF (11/38 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC

Rev.6.5_02
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211D Series
3. 3 S-8211DAN, S-8211DAQ, S-8211DAT, S-8211DAX
Table 13
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = +25°C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
tCU
tDL
tDIOV
tSHORT
−
0.96 1.2 1.4 s 8
5
−
120 150 180 ms 8
5
−
14.5 18 22 ms 9
5
−
240 300 360 μs 9
5
DELAY TIME (Ta = −40°C to +85°C)^*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
tCU
tDL
tDIOV
tSHORT
−
0.7 1.2 2.0 s 8
5
−
83 150 255 ms 8
5
−
10 18 30 ms 9
5
−
150 300 540 μs 9
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is
guaranteed by design, not tested in production.
11