S-8211DAD-M5T1X Datasheet, PDF (10/38 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC

BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211D Series
Rev.6.5_02
3. Detection delay time
3. 1 S-8211DAD, S-8211DAE, S-8211DAG, S-8211DAH, S-8211DAI, S-8211DAJ, S-8211DAK, S-8211DAL,
S-8211DAM, S-8211DAR, S-8211DAS, S-8211DAU, S-8211DAV, S-8211DAW, S-8211DAY, S-8211DAZ,
S-8211DBA, S-8211DBB, S-8211DBC, S-8211DBD, S-8211DBE, S-8211DBF, S-8211DBG
Table 11
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = +25°C)
Overcharge detection delay time
tCU
−
0.96 1.2 1.4 s 8
5
Overdischarge detection delay time
tDL
−
120 150 180 ms 8
5
Discharge overcurrent detection delay time tDIOV
−
7.2
9
11 ms 9
5
Load short-circuiting detection delay time tSHORT
−
240 300 360 μs 9
5
DELAY TIME (Ta = −40°C to +85°C)^*1
Overcharge detection delay time
tCU
−
0.7 1.2 2.0 s 8
5
Overdischarge detection delay time
tDL
−
83 150 255 ms 8
5
Discharge overcurrent detection delay time tDIOV
−
5
9
15 ms 9
5
Load short-circuiting detection delay time tSHORT
−
150 300 540 μs 9
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is
guaranteed by design, not tested in production.
3. 2 S-8211DAF
Table 12
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = +25°C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
tCU
tDL
tDIOV
tSHORT
−
0.96 1.2 1.4 ^{s 8}
5
−
61 75 90 ^{ms 8}
5
−
7.2
9
11 ^{ms 9}
5
−
240 300 360 ^{μs 9}
5
DELAY TIME (Ta = −40°C to +85°C)^*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
tCU
tDL
tDIOV
tSHORT
−
0.7 1.2 2.0 ^{s 8}
5
−
41 75 128 ^{ms 8}
5
−
5
9
15 ^{ms 9}
5
−
150 300 540 ^{μs 9}
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is
guaranteed by design, not tested in production.
10