HYB314400BJ-50- Datasheet, PDF (5/25 Pages) Siemens Semiconductor Group – 1M x 4-Bit Dynamic RAM

HYB 314400BJ-50/-60
3.3 V 1M × 4 DRAM
Absolute Maximum Ratings
Operating temperature range ........................................................................................... 0 to 70 °C
Storage temperature range.................................................................................... – 55 to + 150 °C
Input/output voltage ............................................................................ – 1 to min (V_CC + 0.5, 4.6) V
Power Supply voltage ................................................................................................. – 1 to + 4.6 V
Data out current (short circuit) ............................................................................................... 50 mA
Note: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent
damage of the device. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
DC Characteristics
T_A = 0 to 70 °C, V_SS = 0 V, V_CC = 3.3 V ± 0.3 V, t_T = 5 ns
Parameter
Symbol
Limit Values
min.
max.
Unit Test
Condition
Input high voltage
V_IH
Input low voltage
V_IL
TTL Output high voltage (I_OUT = – 2 mA)
V_OH
TTL Output low voltage (I_OUT = 2 mA)
V_OL
CMOS Output high voltage (I_OUT = – 100 µA) V_OH
CMOS Output low voltage (I_OUT = 100 µA)
V_OL
Input leakage current, any input
I_I(L)
(0 V < V_IN < V_CC + 0.3 V, all other input = 0 V)
Output leakage current
I_O(L)
(DO is disabled, 0 < V_OUT < V_CC)
Average V_CC supply current
I_CC1
-50 version
-60 version
2.0
– 1.0
V_CC + 0.5 V ¹
0.8
V
1
2.4
–
V
1
–
0.4
V
1
V_CC – 0.2 –
V
–
0.2
V
– 10
10
µA ¹
– 10
10
µA ¹
mA ^{2, 3, 4}
–
70
–
60
Standby V_CC supply current
(RAS = CAS = WE = V_IH)
I_CC2
–
Average V_CC supply current during RAS-only I_CC3
refresh cycles
-50 version
–
-60 version
–
2
mA
mA ^{2, 4}
70
60
Average V_CC supply current during fast page I_CC4
mode operation
-50 version
–
-60 version
–
mA ^{2, 3, 4}
50
45
Semiconductor Group
5
1998-10-01