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K4D261638E Datasheet, PDF (10/16 Pages) Samsung semiconductor – 2M x 16Bit x 4 Banks Double Data Rate Synchronous DRAM
K4D261638E
128M DDR SDRAM
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Value
Voltage on any pin relative to Vss
VIN, VOUT
-0.5 ~ 3.6
Voltage on VDD supply relative to Vss
VDD
-1.0 ~ 3.6
Voltage on VDD supply relative to Vss
VDDQ
-0.5 ~ 3.6
Storage temperature
TSTG
-55 ~ +150
Power dissipation
PD
2.0
Short circuit current
IOS
50
Note : Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
POWER & DC OPERATING CONDITIONS(SSTL_2 In/Out)
Recommended operating conditions(Voltage referenced to VSS=0V, TA=0 to 65°C)
Parameter
Device Supply voltage
Output Supply voltage
Reference voltage
Termination voltage
Input logic high voltage
Input logic low voltage
Output logic high voltage
Output logic low voltage
Input leakage current
Output leakage current
Symbol
VDD
VDDQ
VREF
Vtt
VIH(DC)
VIL(DC)
VOH
VOL
IIL
IOL
Min
2.375
2.375
0.49*VDDQ
VREF-0.04
VREF+0.15
-0.30
Vtt+0.76
-
-5
-5
Typ
2.50
2.50
-
VREF
-
-
-
-
-
-
Max
2.625
2.625
0.51*VDDQ
VREF+0.04
VDDQ+0.30
VREF-0.15
-
Vtt-0.76
5
5
Unit
V
V
V
V
V
V
V
V
uA
uA
Unit
V
V
V
°C
W
mA
Note
1,7
1,7
2
3
4
5
IOH=-15.2mA
IOL=+15.2mA
6
6
Note : 1. Under all conditions VDDQ must be less than or equal to VDD.
2. VREF is expected to equal 0.50*VDDQ of the transmitting device and to track variations in the DC level of the same. Peak to
peak noise on the VREF may not exceed + 2% of the DC value. Thus, from 0.50*VDDQ, VREF is allowed + 25mV for DC error
and an additional + 25mV for AC noise.
3. Vtt of the transmitting device must track VREF of the receiving device.
4. VIH(max.)= VDDQ +1.5V for a pulse width and it can not be greater than 1/3 of the cycle rate.
5. VIL(mim.)= -1.5V for a pulse width and it can not be greater than 1/3 of the cycle rate.
6. For any pin under test input of 0V < VIN < VDD is acceptable. For all other pins that are not under test VIN=0V.
7. For the K4D261638E-TC2A, VDD & VDDQ = 2.8V+0.1V
- 10 -
Rev. 1.2 (Jul. 2003)