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HYS64T256020EU-25F-B Datasheet, PDF (23/60 Pages) Qimonda AG – 240-Pin unbuffered DDR2 SDRAM Modules
Internet Data Sheet
HYS[64/72]T256020EU-[25F/2.5/3/3S/3.7]-B
Unbuffered DDR2 SDRAM Module
Parameter
Symbol
DDR2–667
Min.
Max.
Unit
Note1)2)3)4)5)6)7)
8)
Auto-Precharge write recovery + precharge time
Internal write to read command delay
Internal Read to Precharge command delay
Exit self-refresh to a non-read command
Exit self-refresh to read command
Exit precharge power-down to any valid
command (other than NOP or Deselect)
tDAL
tWTR
tRTP
tXSNR
tXSRD
tXP
WR + tnRP
—
7.5
—
7.5
—
tRFC +10
—
200
—
2
—
nCK
ns
ns
ns
nCK
nCK
29)30)
28)31)
28)
28)
Exit power down to read command
Exit active power-down mode to read command
(slow exit, lower power)
CKE minimum pulse width ( high and low pulse
width)
tXARD
tXARDS
tCKE
2
—
7 – AL
—
3
—
nCK
nCK
nCK
32)
Mode register set command cycle time
tMRD
2
MRS command to ODT update delay
tMOD
0
OCD drive mode output delay
tOIT
0
—
nCK
12
ns
28)
12
ns
28)
Minimum time clocks remain ON after CKE
tDELAY
tIS + tCK .AVG + ––
ns
asynchronously drops LOW
tIH
1) For details and notes see the relevant Qimonda component data sheet
2) VDDQ = 1.8 V ± 0.1V; VDD = 1.8 V ± 0.1 V. See notes 5)6)7)8)
3) Timing that is not specified is illegal and after such an event, in order to guarantee proper operation, the DRAM must be powered down
and then restarted through the specified initialization sequence before normal operation can continue.
4) Timings are guaranteed with CK/CK differential Slew Rate of 2.0 V/ns. For DQS signals timings are guaranteed with a differential Slew
Rate of 2.0 V/ns in differential strobe mode and a Slew Rate of 1 V/ns in single ended mode.
5) The CK / CK input reference level (for timing reference to CK / CK) is the point at which CK and CK cross. The DQS / DQS, RDQS / RDQS,
input reference level is the crosspoint when in differential strobe mode.
6) Inputs are not recognized as valid until VREF stabilizes. During the period before VREF stabilizes, CKE = 0.2 x VDDQ is recognized as low.
7) The output timing reference voltage level is VTT.
8) New units, ‘tCK.AVG‘ and ‘nCK‘, are introduced in DDR2–667 and DDR2–800. Unit ‘tCK.AVG‘ represents the actual tCK.AVG of the input clock
under operation. Unit ‘nCK‘ represents one clock cycle of the input clock, counting the actual clock edges. Note that in DDR2–400 and
DDR2–533, ‘tCK‘ is used for both concepts. Example: tXP = 2 [nCK] means; if Power Down exit is registered at Tm, an Active command
may be registered at Tm + 2, even if (Tm + 2 - Tm) is 2 x tCK.AVG + tERR.2PER(Min).
9) When the device is operated with input clock jitter, this parameter needs to be derated by the actual tERR(6-10per) of the input clock. (output
deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2–667 SDRAM has tERR(6-10PER).MIN = – 272
ps and tERR(6- 10PER).MAX = + 293 ps, then tDQSCK.MIN(DERATED) = tDQSCK.MIN – tERR(6-10PER).MAX = – 400 ps – 293 ps = – 693 ps and
tDQSCK.MAX(DERATED) = tDQSCK.MAX – tERR(6-10PER).MIN = 400 ps + 272 ps = + 672 ps. Similarly, tLZ.DQ for DDR2–667 derates to tLZ.DQ.MIN(DERATED)
= - 900 ps – 293 ps = – 1193 ps and tLZ.DQ.MAX(DERATED) = 450 ps + 272 ps = + 722 ps. (Caution on the MIN/MAX usage!)
10) Input clock jitter spec parameter. These parameters are referred to as 'input clock jitter spec parameters' and these parameters apply to
DDR2–667 and DDR2–800 only. The jitter specified is a random jitter meeting a Gaussian distribution.
11) These parameters are specified per their average values, however it is understood that the relationship between the average timing and
the absolute instantaneous timing holds all the times (min. and max of SPEC values are to be used for calculations ).
12) Input waveform timing tDS with differential data strobe enabled MR[bit10] = 0, is referenced from the input signal crossing at the VIH.AC level
to the differential data strobe crosspoint for a rising signal, and from the input signal crossing at the VIL.AC level to the differential data strobe
crosspoint for a falling signal applied to the device under test. DQS, DQS signals must be monotonic between Vil(DC)MAX and Vih(DC)MIN. See
Figure 4.
13) If tDS or tDH is violated, data corruption may occur and the data must be re-written with valid data before a valid READ can be executed.
14) These parameters are measured from a data signal ((L/U)DM, (L/U)DQ0, (L/U)DQ1, etc.) transition edge to its respective data strobe signal
((L/U/R)DQS / DQS) crossing.
Rev. 1.0, 2006-10
23
10262006-SX8C-DEY8