TDA8046 Datasheet, PDF (6/48 Pages) NXP Semiconductors – Multi-mode QAM demodulator

Philips Semiconductors
Multi-mode QAM demodulator
Product specification
TDA8046
SYMBOL
PIN
I/O
DESCRIPTION
TEST1
41
I
test input 1 input (normally connected to ground)
TRST
42
I
optional asynchronous reset input
TCK
43
I
dedicated test clock input
TMS
44
I
input control signal
V_DDD7
V_SSD9
TDO
45
supply digital supply voltage 7; for core (+3.3 V)
46
supply digital ground 9; for core
47
O
serial test data output
TDI
48
I
serial test data input
PRESET
49
I
set device into default mode input
V_SSD10
V_DDD8
I_BIAS
V_AGCTC
V_AGC
V_CARTC
50
supply digital ground 10; for the digital section of the analog block
51
supply digital supply voltage 8; for the digital section of the analog block (+5 V)
52
I
input bias current for DACs
53
O
inverted operational amplifier input voltage for loop filtering
54
O
analog output voltage for AGC
55
O
inverted operational amplifier input voltage for carrier recovery loop
filtering
V_CARREC
V_CLKTC
56
O
analog output voltage for carrier recovery
57
O
inverted operational amplifier input voltage for clock recovery loop
filtering
V_CLKREC
V_SSA
V_DDA
V_SSD11
CLK
V_DDD9
V_SSD12
58
O
analog output voltage for clock recovery
59
supply analog ground
60
supply analog supply voltage (+5 V)
61
supply digital ground 11; for clock
62
I
clock input (4 × r_s)
63
supply digital supply voltage 9; for clock
64
supply digital peripheral ground 12
1996 Nov 19
6