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TDA8046 Datasheet, PDF (5/48 Pages) NXP Semiconductors – Multi-mode QAM demodulator
Philips Semiconductors
Multi-mode QAM demodulator
Product specification
TDA8046
6 PINNING
SYMBOL
PIN
I/O
DESCRIPTION
DIN0
1
I
digital input bit 0 (LSB)
DIN1
2
I
digital input bit 1
DIN2
3
I
digital input bit 2
DIN3
4
I
digital input bit 3
DIN4
5
I
digital input bit 4
VDDD1
VSSD1
DIN5
6
supply digital peripheral supply voltage 1 (+5 V)
7
supply digital ground 1; for input peripheral and core
8
I
digital input bit 5
DIN6
9
I
digital input bit 6
DIN7
10
I
digital input bit 7
DIN8
11
I
digital input bit 8 (MSB)
VSSD2
VDDD2
VSSD3
CLKADC
VDDD3
VSSD4
CLKSDV
12
supply digital ground 2; for core and clock buffers
13
supply digital supply voltage 2; for core and clock buffers (+3.3 V)
14
supply digital peripheral ground 3
15
O
clock output to ADC (4 × rs)
16
supply digital peripheral supply voltage 3 (+5 V)
17
supply digital ground 4; for core
18
O
clock symbol data valid output
CLKT
19
I
for test purpose only
DO7
20
O
parallel data output (bit 7)
DO6
21
O
parallel data output (bit 6)
DO5
22
O
parallel data output (bit 5)
DO4
23
O
parallel data output (bit 4)
VSSD5
VDDD4
VSSD6
DO3
24
supply digital peripheral ground 5
25
supply digital peripheral supply voltage 4 (+5 V)
26
supply digital ground 6; for core
27
O
parallel data output (bit 3)
DO2
28
O
parallel data output (bit 2)
DO1
29
O
parallel data output (bit 1)
DO0
30
O
parallel data output (bit 0)
VSSD7
CLKOUT
31
supply digital peripheral ground 7
32
I
output formatter clock output
VDDD5
VSSD8
SCL
SDA
A0
33
supply digital peripheral supply voltage 5 (+5 V)
34
supply digital peripheral ground 8
35
I
serial clock input (I2C-bus)
36
I/O
serial data input/output (I2C-bus)
37
I
hardware address input (I2C-bus)
VDDD6
TEST3
38
supply digital peripheral supply voltage 6 (+5 V)
39
I
test input 3 (normally connected to ground)
TEST2
40
I
test input 2 (normally connected to ground)
1996 Nov 19
5