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PE9601 Datasheet, PDF (5/14 Pages) Peregrine Semiconductor Corp. – 2200 MHz UltraCMOS™ Integer-N PLL for Rad Hard Applications
PE9601
Product Specification
Table 2. Absolute Maximum Ratings
Symbol
VDD
VI
II
IO
Tstg
Parameter/Conditions Min Max Units
Supply voltage
-0.3 4.0
V
Voltage on any input
DC into any input
-0.3 VDD +
V
0.3
-10 +10 mA
DC into any output
-10 +10 mA
Storage temperature range -65 150 °C
Absolute Maximum Ratings are those values
listed in the above table. Exceeding these values
may cause permanent device damage.
Functional operation should be restricted to the
limits in the DC Electrical Specifications table.
Exposure to absolute maximum ratings for
extended periods may affect device reliability.
Table 3. Operating Ratings
Symbol
VDD
TA
Parameter/Conditions
Supply voltage
Operating ambient
temperature range
Min Max Units
2.85 3.15
V
-40 85
°C
Table 4. ESD Ratings
Symbol
VESD
Parameter/Conditions
ESD voltage (Human Body
Model) – Note 1
Level
1000
Units
V
Note 1: Periodically sampled, not 100% tested. Tested per MIL-
STD-883, M3015 C2
Electrostatic Discharge (ESD) Precautions
When handling this UTSi device, observe the
same precautions that you would use with other
ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the rating specified in Table 4.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS™
devices are immune to latch-up.
Document No. 70-0025-05 │ www.psemi.com
©2005 Peregrine Semiconductor Corp. All rights reserved.
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