CM1231-02SO Datasheet, PDF (8/12 Pages) ON Semiconductor – 2,4,8-Channel Low-Capacitance ESD Protection Array

CM1231−02SO
IEC 61000−4−2
Test Standards
Single Stage
ESD Device
Voltage
Probe
Device Under
Protection (DUP)
R_VARIABLE
Current
Probe
I_RESIDUAL
Figure 9. Single Stage ESD Device Test Setup
IEC 61000−4−2
Test Standards
CM1231
Voltage
Probe
Device Under
Protection (DUP)
R_VARIABLE
Current
Probe
I_RESIDUAL
Figure 10. CM1231−02SO Test Setup
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