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CM1231-02SO Datasheet, PDF (3/12 Pages) ON Semiconductor – 2,4,8-Channel Low-Capacitance ESD Protection Array
CM1231−02SO
Table 3. ELECTRICAL OPERATING CHARACTERISTICS (Note 1)
Symbol
Parameter
Conditions
Min Typ Max Units
VP
Operating Supply Voltage
ICC5
Operating Supply Current
VF
Diode Forward Voltage
Top Diode
Bottom Diode
VP = 5 V
IF = 8 mA, TA = 25°C
5
5.5
V
1
mA
V
0.60 0.80 0.95
0.60 0.80 0.95
VESD
ESD Protection, Contact Discharge per IEC
61000−4−2 Standard
OUT−to−VN Contact
IN−to−VN Contact
TA = 25°C
kV
±12
±4
IRES
Residual ESD Peak Current on RDUP
(Resistance of Device Under Protection)
IEC 61000−4−2 8 kV
RDUP = 5 W, TA = 25°C
A
2.3
VCL
Channel Clamp Voltage
Positive Transients
Negative Transients
IPP = 1 A, TA = 25°C, tP = 8/20 ms,
V
Zap at OUT, Measure at IN
+9
–1.4
RDYN
Dynamic Resistance
Positive Transients
Negative Transients
IPP = 1 A, TA = 25°C, tP = 8/20 ms,
W
Zap at OUT, Measure at IN
0.4
0.3
COUT
OUT Capacitance
f = 1 MHz, VP = 5.0 V, VIN = 2.5 V,
1.5
pF
VOSC = 30 mV
(Note 2)
DCOUT Channel to Channel Capacitance Match
f = 1 MHz, VP = 5.0 V, VIN = 2.5 V,
0.02
pF
VOSC = 30 mV
RS
Series Resistance
1
W
DRS
Channel to Channel Resistance Match
±10 ±30 mW
1. All parameters specified at TA = –40°C to +85°C unless otherwise noted.
2. Capacitance measured from OUT to VN with IN floating.
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
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