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AND8054 Datasheet, PDF (7/28 Pages) ON Semiconductor – Designing RC Oscillator Circuits with Low Voltage Operational Amplifiers and Comparators for Precision Sensor Applications | |||
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AND8054/D
OSCILLATOR DESIGN PROCEDURE
Listed below is a procedure to design RC active
oscillators:
Step 1: Find LG and âs
Step 2: Solve âs = 0 for s = jÏo using methods I, II or III
Method
I:
Solve
remainder
of
N(s)
s2 ) wo2
=0
Method II: Solve N(jÏο)REAL = N(jÏo)IMAG = 0
Method III: Routhâs stability test
Step 3: Form subâcircuit design equations
Step 4: Verify LG ⥠1
Step 1: Find LG and âs
The oscillation frequency is determined by finding the
poles of the denominator of the transfer equation T(s), or
equivalently the zeroes of the numerator N(s) of the
characteristic equation âs. Masonâs Reduction Theorem,
shown in Appendix I, provides a method of determining the
transfer equation from a signal flow diagram. Masonâs
Theorem, listed below, shows that it is not necessary to
obtain the complete T(s) equation. The oscillation frequency
can be determined by analyzing the numerator N(s) of the
âs. âs is found by obtaining the open loop gain (LG) by
breaking the feedback loop and applying a test voltage to the
circuit.
Ç Ç T(s)
+
1
A
* LG
+
A
D(s)
+
A
N(s)
D(s)
Step 2: Solve âs
The second step in the procedure determines the zeroes of
N(s). Several different control theory techniques such as the
Bode or Nyquist stability tests can be used, or one of the
three methods that are listed below. Examples of the
application of the three different methods listed below will
be provided.
Method I: N(s)
s2 ) w2o
An equation is established for the oscillation frequency Ïo
when
N(s)
is
divided
by
s2
+
Ïο2
(i.e.
N(s) )
s2 ) w2o
and
the
remainder is solved to be equal to zero. Method I is easy to
implement for second and third order systems, but with
higher order systems the algebra can be tedious. Method I is
described in [12] and is based on factoring the characteristic
equation to have a s2 + Ïo2 term. For example, when a third
order system can be factored in the form (s + β)(s2 + Ïo2),
the pole locations are at s = ± jÏo and s = âβ. Method I will
be demonstrated by analyzing the absolute oscillator
without the inverter capacitor C4. Although the analysis of
this second order system is trivial because N(s) is already in
the form of s2 + Ïo2, this method can be used for higher order
circuits such as the 4th order ratio oscillator.
Method II: Solve N(jwo)REAL = N(jwo)IMAGINARY = 0
The oscillation equation sometimes can be determined
directly from the characteristic equation by substituting
s = jÏo into N(s) and arranging N(jÏo) into its real and
imaginary parts. This method is usually not feasible for fifth
order and higher oscillators. This procedure is essentially a
subset of the Routh test, because the first two rows of the
Routh array will correspond to N(jÏo)REAL and
N(jÏo)IMAGINARY. If N(s) = jÏo = 0, the poles of the
characteristic equation will be on the imaginary axis at ±jÏο
with an oscillation frequency of Ïo. A summary of the
oscillation equations for 2nd and 3rd order oscillators
obtained using Method II [13] is shown in Appendix II. The
application of Method II is shown for the 3rd order absolute
oscillator with the inverter capacitor C4.
Method III: Routh Stability Test
The Routh stability criterion [12] provides a method that
determines the zeroes of the characteristic equation directly
from the characteristic polynomial coefficients, without the
necessity of factoring the equation. The Routh test, shown
in Appendix III, is the preferred method to use for fourth
order and higher order oscillators. The Routh test consists of
forming a coefficient array. Next, the procedure substitutes
s = jÏo for s, and the summation of the row is set to zero. If
the row equation produces a nontrivial solution for Ïo, the
procedure is complete and the frequency of oscillation is
equal to Ïo. If the row equation does not yield an equation
that can be solved for Ïo, the procedure continues with the
next row in the Routh array. Usually, it is necessary only to
complete the first two or three rows of the Routh array to
produce an equation that can be solved for Ïo. Method III
will be demonstrated by analyzing the ratio oscillator.
Step 3: Subâcircuit Design Equations
The third step in the design procedure is to form the design
equations for the subâcircuits formed by each operational
amplifier. The oscillation equation can be simplified by
selecting the Râs and Câs with the assumptions shown in the
âDesign Equationâ section. The amplifier gain and
pole/zero locations for the absolute and ratio oscillator are
also shown.
Step 4: Verify LG ⥠1
The final step in the procedure verifies that the loop gain
is equal to or greater than one after the Râs and Câs
component values have been chosen. This step is required to
verify that the location and clamping voltage of the limit
circuit will not result in a LG < 1, or that the operational
amplifiers will reach their saturation voltage. The limit
circuit can be located across any of the three amplifiers as
long as the LG ⥠1.
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