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CAT28F001G-12TE13 Datasheet, PDF (6/18 Pages) ON Semiconductor – 1 Megabit CMOS Boot Block Flash Memory
CAT28F001
A.C. CHARACTERISTICS, Program/Erase Operation
VCC = +5V ±10%
JEDEC
Symbol
tAVAV
tAVWH
tWHAX
tDVWH
tWHDX
tELWL
tWHEH
tWLWH
tWHWL
tWHGL
tPHWL
tPHHWH
tVPWH
tWHQV1
tWHQV2
tWHQV3
tWHQV4
tQVVL
tQVPH
tPHBR(1)
tGHHWL
tWHGH
Standard
Symbol
tWC
tAS
tAH
tDS
tDH
tCS
tCH
tWP
tWPH
—
tPS(1)
tPHS(1)
tVPS(1)
—
—
—
—
tVPH(1)
tPHH(1)
—
—
—
Parameter
Write Cycle Time
Address Setup to WE Going High
Address Hold Time from WE Going High
Data Setup Time to WE Going High
Data Hold Time from WE Going High
CE Setup Time to WE Going Low
CE Hold Time from WE Going High
WE Pulse Width
WE High Pulse Width
Write Recovery Time Before Read
RP High Recovery to WE Going Low
RP VHH Setup to WE Going High
VPP Setup to WE Going High
Duration of Programming Operations
Duration of Erase Operations (Boot)
Duration of Erase Operations (Parameter)
Duration of Erase Operations (Main)
VPP Hold from Valid Status Reg Data
RP VHH Hold from Status Reg Data
Boot Block Relock Delay
OE VHH Setup to WE Going Low
OE VHH Hold from WE High
28F001-90
Min Max
90
40
10
40
10
0
0
40
10
0
480
100
100
15
1.3
1.3
3
0
0
100
480
480
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
28F001-12
Min Max
120
40
10
40
10
0
0
40
10
0
480
100
100
15
1.3
1.3
3
0
0
100
480
480
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
ns
ns
ns
µs
Sec
Sec
Sec
ns
ns
ns
ns
ns
Doc. No. MD-1078, Rev. K
6
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Characteristics subject to change without notice