74HC373 Datasheet, PDF (4/9 Pages) NXP Semiconductors – Octal D-type transparent latch; 3-state

74HC373
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
V_CC
(V) – 55 to 25_C v 85_C v 125_C Unit
V_IH Minimum High−Level Input
Voltage
V_out = V_CC – 0.1 V
|I_out| v 20 mA
2.0
1.5
3.0
2.1
4.5
3.15
6.0
4.2
1.5
1.5
V
2.1
2.1
3.15
3.15
4.2
4.2
V_IL Maximum Low−Level Input
Voltage
V_out = 0.1 V
|I_out| v 20 mA
2.0
0.5
3.0
0.9
4.5
1.35
6.0
1.8
0.5
0.5
V
0.9
0.9
1.35
1.35
1.8
1.8
V_OH Minimum High−Level Output
Voltage
V_in = V_IH
|I_out| v 20 mA
2.0
1.9
4.5
4.4
6.0
5.9
1.9
1.9
V
4.4
4.4
5.9
5.9
V_OL Maximum Low−Level Output
Voltage
V_in = V_IH
V_in = V_IL
|I_out| v 20 mA
|I_out| v 2.4 mA 3.0
|I_out| v 6.0 mA 4.5
|I_out| v 7.8 mA 6.0
2.0
4.5
6.0
2.48
3.98
5.48
0.1
0.1
0.1
2.34
2.2
3.84
3.7
5.34
5.2
0.1
0.1
V
0.1
0.1
0.1
0.1
V_in = V_IL
|I_out| v 2.4 mA 3.0
|I_out| v 6.0 mA 4.5
|I_out| v 7.8 mA 6.0
I_in
Maximum Input Leakage Current V_in = V_CC or GND
6.0
I_OZ Maximum Three−State
Leakage Current
Output in High−Impedance State 6.0
V_in = V_IL or V_IH
V_out = V_CC or GND
0.26
0.26
0.26
±0.1
±0.5
0.33
0.4
0.33
0.4
0.33
0.4
±1.0
±1.0
mA
±5.0
±10
mA
I_CC Maximum Quiescent Supply
Current (per Package)
V_in = V_CC or GND
I_out = 0 mA
6.0
4.0
40
40
mA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).
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