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74HC00 Datasheet, PDF (4/7 Pages) NXP Semiconductors – Quad 2-input NAND gate
74HC00
tf
tr
INPUT
A OR B
90%
50%
10%
tPLH
OUTPUT Y
90%
50%
10%
tTLH
VCC
GND
tPHL
tTHL
Figure 1. Switching Waveforms
DEVICE
UNDER
TEST
TEST
POINT
OUTPUT
CL*
*Includes all probe and jig capacitance
Figure 2. Test Circuit
A
Y
B
Figure 3. Expanded Logic Diagram
(1/4 of the Device)
http://onsemi.com
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