74HC74D-T Datasheet, PDF (9/22 Pages) NXP Semiconductors – Dual D-type flip-flop with set and reset; positive-edge trigger

Philips Semiconductors
Dual D-type flip-flop with set and reset;
positive-edge trigger
Product specification
74HC74; 74HCT74
Family 74HCT
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
TEST CONDITIONS
WAVEFORMS
V_CC (V)
MIN.
T_amb = −40 to +85 °C; note 1
V_IH
HIGH-level input
voltage
4.5 to 5.5 2.0
V_IL
V_OH
V_OL
I_LI
I_CC
∆I_CC
LOW-level input voltage
HIGH-level output
voltage
V_I = V_IH or V_IL;
I_O = −4.0 mA
LOW-level output
voltage
V_I = V_IH or V_IL;
I_O = 4.0 mA
input leakage current V_I = V_CC or GND
quiescent supply
current
additional quiescent
supply current per input
V_I = V_CC or GND;
I_O = 0
V_I = V_CC −2.1 V other
inputs at V_CC or GND;
I_O = 0
4.5 to 5.5 −
4.5
3.84
4.5
0.33
5.5
−
5.5
−
4.5 to 5.5 −
T_amb = −40 to +125 °C
V_IH
HIGH-level input
voltage
4.5 to 5.5 2.0
V_IL
V_OH
V_OL
I_LI
I_CC
∆I_CC
LOW-level input voltage
HIGH-level output
voltage
LOW-level output
voltage
input leakage current
quiescent supply
current
additional quiescent
supply current per input
V_I = V_IH or V_IL;
I_O = −4.0 mA
V_I = V_IH or V_IL;
I_O = 4.0 mA
V_I = V_CC or GND
V_I = V_CC or GND;
I_O = 0
V_I = V_CC −2.1 V other
inputs at V_CC or GND;
I_O = 0
4.5 to 5.5 −
4.5
3.7
4.5
−
5.5
−
5.5
−
4.5 to 5.5 −
TYP.
1.6
1.2
4.32
0.15
−
−
100
−
−
−
−
−
−
−
Note
1. All typical values are measured at T_amb = 25 °C.
MAX.
−
0.8
−
−
±1.0
40
450
−
0.8
−
0.4
±1.0
80
490
UNIT
V
V
V
V
µA
µA
µA
V
V
V
V
µA
µA
µA
Remark to HCT types
The value of additional quiescent supply current (∆I_CC) for a unit load of 1 is given here. To determine ∆I_CC per input,
multiply this value by the unit load coefficient shown in the table.
INPUT
UNIT LOAD COEFFICIENT
nD
0.70
nRD
0.70
nSD
0.80
nCP
0.80
2003 Jul 10
9