74HC74D-T Datasheet, PDF (8/22 Pages) NXP Semiconductors – Dual D-type flip-flop with set and reset; positive-edge trigger

Philips Semiconductors
Dual D-type flip-flop with set and reset;
positive-edge trigger
Product specification
74HC74; 74HCT74
DC CHARACTERISTICS
Family 74HC
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
TEST CONDITIONS
WAVEFORMS
V_CC (V)
MIN.
T_amb = −40 to +85 °C; note 1
V_IH
HIGH-level input
voltage
2.0
1.5
4.5
3.15
6.0
4.2
V_IL
LOW-level input voltage
2.0
−
4.5
−
6.0
−
V_OH
HIGH-level output
V_I = V_IH or V_IL
voltage
I_O = −4.0 mA
4.5
3.84
I_O = −5.2 mA
6.0
5.34
V_OL
LOW-level output
V_I = V_IH or V_IL
voltage
I_O = 4.0 mA
4.5
−
I_O = 5.2 mA
6.0
−
I_LI
input leakage current V_I = V_CC or GND
6.0
−
I_CC
quiescent supply
V_I = V_CC or GND;
6.0
−
current
I_O = 0
T_amb = −40 to +125 °C
V_IH
HIGH-level input
voltage
2.0
1.5
4.5
3.15
6.0
4.2
V_IL
LOW-level input voltage
2.0
−
4.5
−
6.0
−
V_OH
HIGH-level output
V_I = V_IH or V_IL
voltage
I_O = −4.0 mA
4.5
3.7
I_O = −5.2 mA
6.0
5.2
V_OL
LOW-level output
V_I = V_IH or V_IL
voltage
I_O = 4.0 mA
4.5
−
I_O = 5.2 mA
6.0
−
I_LI
input leakage current V_I = V_CC or GND
6.0
−
I_CC
quiescent supply
V_I = V_CC or GND;
6.0
−
current
I_O = 0
TYP.
1.2
2.4
3.2
0.8
2.1
2.8
4.32
5.81
0.15
0.16
−
−
−
−
−
−
−
−
−
−
−
−
−
−
Note
1. All typical values are measured at T_amb = 25 °C.
MAX. UNIT
−
V
−
V
−
V
0.5
V
1.35
V
1.8
V
−
V
−
V
0.33
V
0.33
V
±1.0
µA
40
µA
−
V
−
V
−
V
0.5
V
1.35
V
1.8
V
−
V
−
V
0.4
V
0.4
V
±1.0
µA
80
µA
2003 Jul 10
8