GTL2005 Datasheet, PDF (5/19 Pages) NXP Semiconductors – Quad GTL/GTL to LVTTL/TTL bidirectional non-latched translator

NXP Semiconductors
GTL2005
Quad GTL/GTL+ to LVTTL/TTL bidirectional non-latched translator
8. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).^[1]
Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
Conditions
Min
Max
Unit
V_CC
DC supply voltage
I_IK
DC input diode current
V_I < 0 V
V_I
DC input voltage
A port
B port
−0.5
+4.6
V
-
−50
mA
−0.5^[2] +7.0
V
−0.5^[2] +4.6
V
I_OK
DC output diode current
V_O < 0 V
-
−50
mA
V_O
DC output voltage
output in OFF or
−0.5^[2] +7.0
V
HIGH state; A port
output in OFF or
−0.5^[2] +4.6
V
HIGH state; B port
I_OL
current into any output in B port
the LOW state
A port
-
128
mA
-
80
mA
I_OH
current into any output in B port
the HIGH state
-
−64
mA
T_stg
storage temperature range
[3] _−60
+150
°C
[1] Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only
and functional operation of the device at these or any other conditions beyond those indicated under
Section 9 “Recommended operating conditions” is not implied. Exposure to absolute-maximum-rated
conditions for extended periods may affect device reliability.
[2] The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings
are observed.
[3] The performance capability of a high-performance integrated circuit in conjunction with its thermal
environment can create junction temperatures which are detrimental to reliability. The maximum junction
temperature of this integrated circuit should not exceed 150 °C.
GTL2005_7
Product data sheet
Rev. 07 — 3 February 2009
© NXP B.V. 2009. All rights reserved.
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