 English |
|
|
|
|
|
|
|
| 74HC595BQ115 Datasheet, PDF (15/24 Pages) NXP Semiconductors – 8-bit serial-in, serial or parallel-out shift register with output latches; 3-state | |||
| |||
| ◁ |
NXP Semiconductors
74HC595; 74HCT595
8-bit serial-in, serial or parallel-out shift register with output latches;
3-state
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Test data is given in Table 9.
Definitions for test circuit:
CL = load capacitance including jig and probe capacitance.
RL = load resistance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
S1 = test selection switch.
Fig 14. Test circuit for measuring switching times
Table 9. Test data
Type
Input
74HC595
74HCT595
VI
tr, tf
VCC
6 ns
3V
6 ns
Load
CL
50 pF
50 pF
RL
1 kï
1 kï
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74HC_HCT595
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 6 â 12 December 2011
© NXP B.V. 2011. All rights reserved.
15 of 24
|
▷ |
German
Russian
Spanish
Italian
Polish
Chinese
Japanese
Korean
French
Portuguese