OPA2830 Datasheet, PDF (7/43 Pages) National Semiconductor (TI) – Dual, Low-Power, Single-Supply, Wideband OPERATIONAL AMPLIFIER

OPA2830
www.ti.com.................................................................................................................................................. SBOS309D – AUGUST 2004 – REVISED AUGUST 2008
ELECTRICAL CHARACTERISTICS: V_S = +3V
Boldface limits are tested at +25C.
At T_A = +25°C, G = +2V/V, and R_L = 150Ω to V_S/3, unless otherwise noted (see Figure 71).
OPA2830ID, IDGK
MIN/MAX OVER
TYP
TEMPERATURE
PARAMETER
CONDITIONS
+25°C
+25°C ⁽¹⁾
0°C to
+70°C ⁽²⁾
AC PERFORMANCE (see Figure 71)
Small-Signal Bandwidth
Gain-Bandwidth Product
G = +2, V_O ≤ 0.2V_PP
G = +5, V_O ≤ 0.2V_PP
G = +10, V_O ≤ 0.2V_PP
G ≥ +10
90
70
66
20
15
14
9
7.5
6.5
90
75
65
Slew Rate
1V Step
220
135
105
Rise Time
0.5V Step
3.4
5.6
5.7
Fall Time
0.5V Step
3.4
5.6
5.7
Settling Time to 0.1%
1V Step
46
73
88
Harmonic Distortion
2nd-Harmonic
3rd-Harmonic
Input Voltage Noise
V_O = 1V_PP, f = 5MHz
R_L = 150Ω
R_L ≥ 500Ω
R_L = 150Ω
R_L ≥ 500Ω
f > 1MHz
–60
–56
–54
–64
–59
–57
–68
–59
–58
–72
–65
–64
9.2
10.3
10.8
Input Current Noise
DC PERFORMANCE⁽⁴⁾
f > 1MHz
3.5
4.6
5.1
Open-Loop Voltage Gain
72
66
65
Input Offset Voltage
±1.5
±7.5
±8.7
Average Offset Voltage Drift
—
±27
Input Bias Current
Input Bias Current Drift
V_CM = 1.0V
+5
+10
+12
±44
Input Offset Current
Input Offset Current Drift
V_CM = 1.0V
±0.2
±1.1
±1.3
—
±5
INPUT
Least Positive Input Voltage
–0.45
–0.4
–0.27
Most Positive Input Voltage
1.2
1.1
1.0
Common-Mode Rejection Ratio (CMRR)
Input-Referred
80
74
72
Input Impedance
Differential Mode
10 || 2.1
Common-Mode
400 || 1.2
OUTPUT
Least Positive Output Voltage
Most Positive Output Voltage
Current Output, Sinking and Sourcing
G = +5, R_L = 1kΩ to 1.5V
G = +5, R_L = 150Ω to 1.5V
G = +5, R_L = 1kΩ to 1.5V
G = +5, R_L = 150Ω to 1.5V
0.08
0.11
0.125
0.17
0.39
0.40
2.91
2.88
2.85
2.82
2.74
2.70
±30
±20
±18
Short-Circuit Output Current
Output Shorted to Either Supply
45
Closed-Loop Output Impedance
See Figure 71, f < 100kHz
0.06
UNITS
MHz
MHz
MHz
MHz
V/µs
ns
ns
ns
dBc
dBc
dBc
dBc
nV/√Hz
pA/√Hz
dB
mV
µV/°C
µA
nA/°C
µA
nA/°C
V
V
dB
kΩ || pF
kΩ || pF
V
V
V
V
mA
mA
Ω
MIN/
MAX
TEST
LEVEL ⁽³⁾
min
B
min
B
min
B
min
B
min
B
max
B
max
B
max
B
min
B
min
B
min
B
min
B
max
B
max
B
min
A
max
A
max
B
max
A
max
B
max
A
max
B
max
A
min
A
min
A
typ
C
typ
C
max
A
max
A
min
A
min
A
min
A
typ
C
typ
C
(1) Junction temperature = ambient for +25°C specifications.
(2) Junction temperature = ambient at low temperature limits; junction temperature = ambient +20°C at high temperature limit for over
temperature specifications.
(3) Test levels: (A) 100% tested at +25°C. Over temperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
(4) Current is considered positive out of node.
Copyright © 2004–2008, Texas Instruments Incorporated
Product Folder Link(s): OPA2830
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