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GCM31A7U2J102JX01D Datasheet, PDF (15/43 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors for Automotive
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10.5.20 • This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
1 SGpCeMciSficeariteiosnSspaencdifiTceastitoMn eatnhdodTsest Methods
Continued from the preceding page.
No.
AEC-Q200
Test Item
Specifications
Temperature Compensating Type
High Dielectric Type
AEC-Q200 Test Method
Thermal Shock
Appearance
Capacitance
Change
14
Q/D.F.
I.R.
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within ±2.5% or ±0.25pF
(Whichever is larger)
Within ±10.0%
30pF min.: QU1000
30pF max.: QU400+20C
C: Nominal Capacitance (pF)
*1
W.V.: 25Vmin.: 0.025 max.
W.V.: 16V: 0.035 max.
More than 10,000MΩ or 500Ω · F
*1
(Whichever is smaller)
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as (18). Perform the 300 cycles
according to the two heat treatments listed in the following table
(Maximum transfer time is 20 seconds). Let sit for 24±2 hours at
room temperature, then measure.
Step
1
Temp. (°C) -55+0/-3
Time (min.) 15±3
2
125+3/-0 (5C, C7, R7)
15±3
• Initial measurement for high dielectric constant type
Perform a heat treatment at 150Y W1 00 °C for one hour and then
let sit for 24±2 hours at room temperature.
Perform the initial measurement.
Appearance No marking defects
Capacitance
Change
Within the specified tolerance
15 ESD
Q/D.F.
30pF min.: QU1000
30pF max.: QU400+20C
C: Nominal Capacitance (pF)
*1 Per AEC-Q200-002
W.V.: 25Vmin.: 0.025 max.
W.V.: 16V: 0.035 max.
I.R.
More than 10,000MΩ or 500Ω · F
(Whichever is smaller)
*1
(a) Preheat at 155°C for 4 hours. After preheating, immerse the
capacitor in a solution of ethanol (JIS-K-8101) and rosin (JIS-
K-5902) (25% rosin in weight proportion). Immerse in eutectic
solder solution for 5+0/-0.5 seconds at 235±5°C.
16 Solderability
95% of the terminations is to be soldered evenly and
continuously.
(b) Should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol (JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in
weight proportion). Immerse in eutectic solder solution for
5+0/-0.5 seconds at 235±5°C.
(c) Should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol (JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in
weight proportion). Immerse in eutectic solder solution for 120
±5 seconds at 260±5°C.
Appearance No defects or abnormalities
Visual inspection.
Electrical
17 Characteri-
zation
Capacitance
Change
Q/D.F.
I.R.
Within the specified tolerance
30pF min.: QU1000
30pF max.: QU400+20C
C: Nominal Capacitance (pF)
25°C
More than 100,000MΩ or 1,000Ω · F
(Whichever is smaller)
Max. Operating Temperature···125°C
More than 10,000MΩ or 100Ω · F
(Whichever is smaller)
*1
W.V.: 25V min.: 0.025 max.
W.V.: 16V: 0.035 max
The capacitance/Q/D.F. should be measured at 25°C at the
frequency and voltage shown in the table.
(1) Temperature Compensating Type
Capacitance
CV1000pF
CG1000pF
Frequency
1±0.1MHz
1±0.1kHz
Voltage
0.5 to 5Vrms
1±0.2Vrms
(2) High Dielectric Type
Capacitance
CV10µF
CG10µF
Frequency
1±0.1kHz
120±24Hz
Voltage
1±0.2Vrms
0.5±0.1Vrms
*1
25°C
More than 10,000MΩ or 500Ω · F
(Whichever is smaller)
Max. Operating Temperature···125°C
More than 1,000MΩ or 10Ω · F
(Whichever is smaller)
The insulation resistance should be measured with a DC voltage
not exceeding the rated voltage at 25°C and 125°C and within 2
minutes of charging.
Dielectric
Strength
No failure
No failure should be observed when 250% of the rated voltage is
applied between the terminations for 1 to 5 seconds, provided the
charge/discharge current is less than 50mA.
*1: The figure indicates typical specification. Please refer to individual specifications.
Continued on the following page.
16