M38197MA Datasheet, PDF (54/60 Pages) Mitsubishi Electric Semiconductor – SINGLE-CHIP 8-BIT CMOS MICROCOMPUTER

MITSUBISHI MICROCOMPUTERS
3819 Group
SINGLE-CHIP 8-BIT CMOS MICROCOMPUTER
ELECTRICAL CHARACTERISTICS (Vcc = 4.0 to 5.5 V, Ta = –10 to 85°C, unless otherwise noted)
Symbol
Parameter
Test conditions
Limits
Min.
Typ.
“H” output voltage P00–P07, P10–P17, P20–P23,
VOH
P30–P37, P80–P87, P90–P97,
PA0–PA7
“H” output voltage P24–P27, P41–P44, P46, P47,
VOH
P50–P57, P60–P67, P70–P77,
PB0–PB3
“L” output voltage P24–P27, P41–P44, P46, P47,
VOL
P50–P57, P60–P67, P70–P77,
PB0–PB3
VT+–VT–
VT+–VT–
VT+–VT–
IH
IH
IH
IH
IL
IL
IL
IL
ILOAD
Hysteresis INT0–INT4, SIN1, SIN2, SIN3, SCLK11,
SCLK2, SCLK3, CS, CNTR0, CNTR1
Hysteresis RESET, XIN
Hysteresis XCIN
“H” input current P24–P27, P40–P47, P50–P57,
P60–P67, P70–P77, PB0–PB3
“H” input current P80–P87, PA0–PA7 (Note)
“H” input current RESET, XCIN
“H” input current XIN
“L” input current P24–P27, P40–P47, P50–P57,
P60–P67, P70–P77, PB0–PB3
“L” input current P80–P87, PA0–PA7 (Note)
“L” input current RESET, XCIN
“L” input current XIN
Output load current P00–P07, P10–P17, P20–P23,
P30–P37, P90–P97
ILEAK
Output leakage current P00–P07, P10–P17,
P20–P23, P30–P37,
P80–P87, P90–P97,
PA0–PA7
VRAM
RAM hold voltage
Note : Except when reading ports P8 or PA.
IOH=–18 mA
IOH=–10 mA
IOL=10 mA
When using a non-port
function
VI=VCC
VI=VCC
VI=VCC
VI=VCC
VI=VSS
VI=VSS
VI=VSS
VI=VSS
VEE=VCC–36 V, VOL=VCC,
Output transistors “off”
VEE=VCC–38 V,
VOL=VCC–38 V,
Output transistors “off”
When clock is stopped
VCC–2.0
VCC–2.0
150
2
0.4
0.5
0.5
4.0
–4.0
500
Unit
Max.
V
V
2.0
V
V
V
V
5.0
µA
5.0
µA
5.0
µA
µA
–5.0
µA
–5.0
µA
–5.0
µA
µA
900
µA
–10
µA
5.5
V
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