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APT150GT120JR Datasheet, PDF (2/6 Pages) Microsemi Corporation – Thunderbolt IGBT
Dynamic Characteristics
Symbol Characteristic
Test Conditions
Min
Cies
Coes
Cres
VGEP
Qg
Qge
Qgc
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate-to-Emitter Plateau Voltage
Total Gate Charge
Gate-Emitter Charge
Gate-Collector Charge
SSOA Switching Safe Operating Area
td(on)
··tr
td(off)
tf
Eon1
Eon2
Eoff
td(on)
tr
td(off)
tf
Eon1
Eon2
Eoff
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
Turn-On Switching Energy 4
Turn-On Switching Energy 5
Turn-Off Switching Energy 6
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
Turn-On Switching Energy 4
Turn-On Switching Energy 5
Turn-Off Switching Energy 6
-
VGE = 0V, VCE = 25V
-
f = 1MHz
-
Gate Charge
-
VGE = 15V
-
VCE= 600V
-
IC = 150A
-
TJ = 150°C, RG = 1.0Ω 7, VGE = 15V, 450
L = 100μH, VCE= 1200V
-
Inductive Switching (25°C)
-
VCC = 800V
-
VGE = 15V
-
IC = 150A
RG = 2.2Ω
-
TJ = +25°C
-
-
-
Inductive Switching (125°C)
-
VCC = 800V
-
VGE = 15V
-
IC = 150A
-
RG = 2.2Ω
-
TJ = 125°C
-
APT150GT120JR
Typ Max Unit
9300
-
1400
-
pF
700
-
10
-
V
995
-
110
-
nC
595
-
A
80
-
N/A
-
ns
570
-
70
-
TBD
-
24.3
-
mJ
12.7
-
80
-
165
-
ns
635
-
75
-
TBD
-
33.5
-
mJ
14.8
-
Thermal and Mechanical Characteristics
Symbol Characteristic / Test Conditions
Min Typ Max Unit
RθJC
WT
Junction to Case
Package Weight
Torque Terminals and Mounting Screws.
VIsolation RMS Voltage (50-60Hz Sinusoidal Waveform from Terminals to Mounting Base for 1 Min.)
-
-
0.15 °C/W
-
29.2
-
gm
-
-
10
in·lbf
-
-
1.1
N·m
2500
-
-
Volts
1 Repetitive Rating: Pulse width limited by maximum junction temperature.
2 For Combi devices, Ices includes both IGBT and FRED leakages.
3 See MIL-STD-750 Method 3471.
4 Eon1 is the clamped inductive turn-on energy of the IGBT only, without the effect of a commutating diode reverse recovery current adding to
the IGBT turn-on loss. Tested in inductive switching test circuit shown in figure 21, but with a Silicon Carbide diode.
5 Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. (See Figures 21, 22.)
6 Eoff is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.)
7 RG is external gate resistance not including gate driver impedance.
Microsemi reserves the right to change, without notice, the specifications and information contained herein.