A3PE600L-FGG484M Datasheet, PDF(171/212 Page) Microsemi Corporation – Each Device Tested from –55°C to 125°C, Not Susceptible to Neutron-Induced Configuration Loss

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A3PE600L-FGG484M Datasheet, PDF (171/212 Pages) Microsemi Corporation – Each Device Tested from –55°C to 125°C, Not Susceptible to Neutron-Induced Configuration Loss

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4 â Package Pin Assignments

VQ100

100

1

Note: This is the top view of the package.

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http://www.actel.com/products/solutions/package/docs.aspx.

Revision 3

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