MAX16070 Datasheet, PDF (38/52 Pages) Maxim Integrated Products – 12-Channel/8-Channel, Flash-Configurable System Monitors with Nonvolatile Fault Registers

12-Channel/8-Channel, Flash-Configurable System
Managers with Nonvolatile Fault Registers
REGISTERS
AND FLASH
MEMORY WRITE REGISTER
[LENGTH = 8 BITS]
MEMORY READ REGISTER
[LENGTH = 8 BITS]
MEMORY ADDRESS REGISTER
[LENGTH = 8 BITS]
USER CODE REGISTER
[LENGTH = 32 BITS]
IDENTIFICATION REGISTER
[LENGTH = 32 BITS]
BYPASS REGISTER
[LENGTH = 1 BIT]
01100
01011
01010
01001
01000
00111
00110
MUX 1
00101
00100
00011
00000
11111
COMMAND
DECODER
01001
01010
01011
01100
01000
00111
SETFLSHADD
RSTFLSHADD
SETUSRFLSH
RSTUSRFLSH
SAVE
REBOOT
V_DB
R_PU
TDI
TMS
TCK
INSTRUCTION REGISTER
[LENGTH = 5 BITS]
TEST ACCESS PORT
(TAP) CONTROLLER
MUX 2
TDO
Figure 12. JTAG Block Diagram
Test Access Port (TAP)
Controller State Machine
The TAP controller is a finite state machine that responds
to the logic level at TMS on the rising edge of TCK. See
Figure 13 for a diagram of the finite state machine. The
possible states are described in the following:
Test-Logic-Reset: At power-up, the TAP controller
is in the test-logic-reset state. The instruction register
contains the IDCODE instruction. All system logic of the
device operates normally. This state can be reached
from any state by driving TMS high for five clock cycles.
Run-Test/Idle: The run-test/idle state is used between
scan operations or during specific tests. The instruction
register and test data registers remain idle.
Select-DR-Scan: All test data registers retain their previ-
ous state. With TMS low, a rising edge of TCK moves the
controller into the capture-DR state and initiates a scan
sequence. TMS high during a rising edge on TCK moves
the controller to the select-IR-scan state.
Capture-DR: Data can be parallel-loaded into the test
data registers selected by the current instruction. If the
instruction does not call for a parallel load or the selected
test data register does not allow parallel loads, the test
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