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W2350EP Datasheet, PDF (7/12 Pages) Keysight Technologies – High Speed Digital Design
Decomposition of TDR/TDT measurements
Time Domain Relectometry (TDR)
and Time Domain Transmission (TDT)
are measurement techniques that
characterize a complex channel by
sending an abrupt voltage step down
a line and comparing the incident,
transmitted, and relected voltage
waves. The shape and polarity of the
transmission and relection gives
information about the position and
nature of impedance changes at each
discontinuity. Transient Convolution
Simulator and the front panel TDR
feature combine to form a highly
accurate method for decomposing the
measured TDR/TDT response into
component behavior. By adjusting
the component parameters to it the
composite response, you can reveal
the cause of the underlying channel
impairments.
TDR into channel 1& 1
3
600
500
300
500
100
TDR
400
-100
Time (nsec)
60
10
40
0
20
0
-10
-20
-20
Time (nsec)
2
4
TDT
Time (nsec)
Time (nsec)
Figure 6. TDR/TDT response for a 2.5-Gbps differential channel
Broadband SPICE Model Generator
The Broadband SPICE Model
Generator provides the capability
to convert measured or simulated
S-parameter models to lumped equiv-
alent or pole zero representations.
Lumped equivalent representations
can be used with various types of
SPICE simulators. It also gives you
the ability to enforce passivity during
broadband SPICE model extractions.
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