Y9071B Datasheet, PDF (4/29 Pages) Keysight Technologies – Measurement Applications For the E6640A EXM Wireless Test Set

04 | Keysight | Measurement Applications for the E6640A EXM Wireless Test Set - Solution Brochure
Accelerate Time to Volume Manufacturing
Manufacturing test integration
Keysight’s Manufacturing Test Integration program, an ongoing collaboration with
chipset vendors, provides you with chipset vendor-approved tools to test your wireless
devices now and in the future. To make your production line run as fast as possible, EXM
supports the latest generation of fast-sequenced calibration and verification techniques.
In addition, wireless chipset vendors can benefit by working with Keysight’s indus-
try-proven measurement experts to achieve the highest test speed possible for specific
chipsets as they are brought to market.
Test automation platform
If you are doing your own chipset software development, Keysight has created a
reference solution called the Keysight Test Automation Platform (TAP). This tool supplies
you with the framework for optimizing calibration and verification procedures of the
leading wireless chipsets. TAP software also serves as a development guide or blueprint
for instrument and chipset automation, and explains how to integrate automation
instructions together for test steps. In addition to serving as a test development guide
for development of your own test executive or shop floor tools, the TAP tool can be run
on the lab bench by new product introduction (NPI) engineers using a graphical user
interface (GUI).
Whether using chipset vendors’ test tools or the Keysight TAP reference solution, you
will save engineering test time and cost, allowing you to focus on your core business
of device design, development, and manufacturing. Plus, if you are developing your
own test tools, Keysight’s technical experts are available to provide instrument control
expertise to speed up and optimize your test plan.
Accelerate Test Execution
Advanced sequencing
EXM is part of Keysight’s comprehensive Power of X Suite of test products, and comes
standard with a source list and sequence analyzer. The powerful sequence analyzer
function, which includes a set of full-featured analysis tools, synchronizes EXM’s source
and signal analyzer, facilitates measurement of the device under test (DUT), and provides
a host of other capabilities to increase speed and throughput in non-signaling manufac-
turing test.
WLAN manufacturing test has been predominantly non-signaling test for many years.
The nature of non-signaling test eliminates the protocol-based interaction between the
tester and DUT, which makes the manufacturing test much faster than signaling mode.
Now chipset vendors are improving the non-signaling test modes to achieve even higher
test throughput.
One important new test methodology is sequencer-based Tx measurement. With this
methodology, the DUT transmits a pre-defined signal sequence that includes various
power level, modulation, or even frequency changes, without the time penalty for
adjusting the DUT for each of the changes individually.
EXM’s flexible sequencer uses this same technique to facilitate faster testing with current
chipsets and their test modes, and allow for future advances in the chipset test modes.
est ^vendor)
Collaboration
for test
integration
Device _production
Chipset vendor or UE manufacturer’s tools
Figure 2. Test integration collaboration
Execute test plans at the chipset’s
highest achievable speed using
the powerful and flexible EXM
sequencer:
–– Designed for non-signaling,
ultra-fast device calibration and
verification
–– Works in synch with chipset test
modes to eliminate signaling
overhead
–– Enables single acquisition with
multiple measurements
–– Allows precise control of test
intervals, test levels, and
measurement timing
–– Performs multi-technology
sweeps