E6704A Datasheet, PDF (4/15 Pages) Keysight Technologies – E6702G cdma2000/IS-95/AMPS

04 | Keysight | E6702F cdma2000/IS-95/AMPS Lab Application - Technical Overview
CDMA receiver tests
–– Fundamental/traffic channel sensitivity
–– Demodulation of F-FCH in multipath fading
–– Demodulation of F-FCH in multipath fading with closed loop power control (FPC_Mode=000)
–– Demodulation of F-FCH in multipath fading with outer loop and closed loop power control
(FPC_Mode=000)
–– Supplemental channel sensitivity
–– Dynamic range
–– Demodulation with AWGN
–– Slotted paging channel MER
AMPS transmitter tests
–– RF power output
–– RF frequency and frequency error
–– FM modulation limiting
–– FM deviation and distortion
–– Audio frequency response
–– Audio distortion
–– FM hum and noise
–– SAT deviation and frequency error
–– Compressor response
–– Signaling tone frequency and deviation
–– DTMF symbol, frequency, and deviation
–– Wideband data deviation
AMPS receiver tests
–– SINAD
–– Audio frequency response
–– Audio distortion
–– FM hum and noise
–– Expander response
Fading tests
Option 004 adds a rear panel digital bus that enables fading when used with the N5106A
PXB baseband generator and channel emulator. This solution provides receiver fading
tests with unprecedented accuracy and repeatability at a very attractive price point.
Baseband I/Q data from the E5515C/E is sent via the digital bus to the PXB, where real-
time fading is applied based on user-selected fading profiles. After digital fading, AWGN
can be digitally added to the waveform. The resulting waveform is then returned to the
test set via the digital bus for modulation. This solution eliminates almost all associated
calibrations and provides rock-solid repeatability. Typical Eb/Nt repeatability for fading
tests with fast forward power control enabled is less than 0.1 dB.
Get the proven benefits of the Keysight 8960 test set
Because this cdma2000 test solution is based on the high-performance 8960 Series 10
test set, you gain the additional benefits of extremely fast measurement speed, ease of
programming, accuracy, reliability, and worldwide service and support. These proven
features help you shorten test development time, increase throughput, and minimize
support costs.