N1045A Datasheet, PDF (26/37 Pages) Keysight Technologies – Wide-Bandwidth Oscilloscope Mainframe and Modules

26 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet
Software Applications (Continued)
86100D-SIM InfiniiSim-DCA
At higher data rates, the effect of measurement fixtures and
channels is prominent and can be accounted for through the
de-embedding capabilities within Option SIM. You may also view
measurements on live and simulated signals, allowing you to
compare design intent to actual performance.
N1019A user-defined application
You may create your own test application or suite of tests using
the DCA-X and other instruments. Quickly and intuitively create
groups of tests, test descriptions, user prompts and test limits.
Use concise HTML reports to share your multiple test results with
your users.
N1012A OIF CEI compliance and debug
application
The N1012A application lets you fully characterize the ~120
transmitter test parameters (including 28G-VSR), reducing your
test time from hours to minutes. Included are return loss tests
and several utilities to improve your test productivity. Debug
mode enables you to characterize your devices well beyond the
parameters prescribed in the implementation agreements.
N1014A SFF-8431 compliance and debug
application
The N1014A application lets you fully characterize ~70 test
parameters including all transmitter tests for host, module and
host copper and all test signals for receiver testing. Return loss
tests and utilities are also included.
N1081-4A IEEE802.3 Ethernet applications
The extensive requirements for IEEE802.3-2012, 802.3bj and
802.3bm are covered in these four applications, which comprise
> 400 tests. Characterize your device for one, four or ten lanes,
and analyze trends over time/temperature and between devices.
86100D-BFP Automatic Fixture Removal (AFR)
When measuring physical layer devices with non-coaxial
interfaces, test fixtures or probes are often used to connect the
device under test (DUT) to the measurement equipment. For
accurate measurements of the DUT, the fixtures or probes need
to be characterized and their effects removed from the composite
measurement of the DUT plus test fixture or probe combination.
This option adds the Automatic Fixture Removal (AFR) capability
from Keysight’s powerful N1930B Physical Layer Test System
(PLTS) software to help you characterize a fixture or probe with
non-coaxial interfaces. Fixtures and probes to be characterized
can be single-ended or differential.